TY - GEN
T1 - Efficient decision ordering techniques for SAT-based test generation
AU - Chen, Mingsong
AU - Qin, Xiaoke
AU - Mishra, Prabhat
PY - 2010
Y1 - 2010
N2 - Model checking techniques are promising for automated generation of directed tests. However, due to the prohibitively large time and resource requirements, conventional model checking techniques do not scale well when checking complex designs. In SAT-based BMC, many variable ordering heuristics have been investigated to improve counterexample (test) generation involving only one property. This paper presents efficient decision ordering techniques that can improve the overall test generation time of a cluster of similar properties. Our method exploits the assignments of previously generated tests and incorporates it in the decision ordering heuristic for current test generation. Our experimental results using both software and hardware benchmarks demonstrate that our approach can drastically reduce the overall test generation time.
AB - Model checking techniques are promising for automated generation of directed tests. However, due to the prohibitively large time and resource requirements, conventional model checking techniques do not scale well when checking complex designs. In SAT-based BMC, many variable ordering heuristics have been investigated to improve counterexample (test) generation involving only one property. This paper presents efficient decision ordering techniques that can improve the overall test generation time of a cluster of similar properties. Our method exploits the assignments of previously generated tests and incorporates it in the decision ordering heuristic for current test generation. Our experimental results using both software and hardware benchmarks demonstrate that our approach can drastically reduce the overall test generation time.
UR - https://www.scopus.com/pages/publications/77953101934
M3 - 会议稿件
AN - SCOPUS:77953101934
SN - 9783981080162
T3 - Proceedings -Design, Automation and Test in Europe, DATE
SP - 490
EP - 495
BT - DATE 10 - Design, Automation and Test in Europe
T2 - Design, Automation and Test in Europe Conference and Exhibition, DATE 2010
Y2 - 8 March 2010 through 12 March 2010
ER -