Effect of thickness on the dielectric property and nonlinear current-voltage behavior of CaCu3Ti4O12 thin films

Y. W. Li; Y. D. Shen; Z. G. Hu; F. Y. Yue; J. H. Chu

doi:10.1016/j.physleta.2009.05.001

Effect of thickness on the dielectric property and nonlinear current-voltage behavior of CaCu₃Ti₄O₁₂ thin films

Y. W. Li^*, Y. D. Shen, Z. G. Hu, F. Y. Yue, J. H. Chu

^*Corresponding author for this work

School of Physics and Electronic Science

Research output: Contribution to journal › Article › peer-review

15 Scopus citations

Abstract

Dielectric properties and leakage current behavior in CaCu₃Ti₄O₁₂ (CCTO) films with different thickness are studied. It is found that the permittivity is affected simultaneously by the electrode interface and the microstructure of the film. The influence of the interfacial layer reduces and the ac electric process transfers from grain boundary to bulk conductivity relaxation with the film thickness increasing. The Poole-Frenkel emission is dominated in thicker CCTO film. Interface-related conductive process coexists with the bulk-limited process in thinner film.

Original language	English
Pages (from-to)	2389-2392
Number of pages	4
Journal	Physics Letters, Section A: General, Atomic and Solid State Physics
Volume	373
Issue number	27-28
DOIs	https://doi.org/10.1016/j.physleta.2009.05.001
State	Published - 22 Jun 2009

Keywords

Dielectrics
Electrical properties
Sol-gel

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10.1016/j.physleta.2009.05.001

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title = "Effect of thickness on the dielectric property and nonlinear current-voltage behavior of CaCu3Ti4O12 thin films",

abstract = "Dielectric properties and leakage current behavior in CaCu3Ti4O12 (CCTO) films with different thickness are studied. It is found that the permittivity is affected simultaneously by the electrode interface and the microstructure of the film. The influence of the interfacial layer reduces and the ac electric process transfers from grain boundary to bulk conductivity relaxation with the film thickness increasing. The Poole-Frenkel emission is dominated in thicker CCTO film. Interface-related conductive process coexists with the bulk-limited process in thinner film.",

keywords = "Dielectrics, Electrical properties, Sol-gel",

author = "Li, \{Y. W.\} and Shen, \{Y. D.\} and Hu, \{Z. G.\} and Yue, \{F. Y.\} and Chu, \{J. H.\}",

year = "2009",

month = jun,

day = "22",

doi = "10.1016/j.physleta.2009.05.001",

language = "英语",

volume = "373",

pages = "2389--2392",

journal = "Physics Letters, Section A: General, Atomic and Solid State Physics",

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TY - JOUR

T1 - Effect of thickness on the dielectric property and nonlinear current-voltage behavior of CaCu3Ti4O12 thin films

AU - Li, Y. W.

AU - Shen, Y. D.

AU - Hu, Z. G.

AU - Yue, F. Y.

AU - Chu, J. H.

PY - 2009/6/22

Y1 - 2009/6/22

N2 - Dielectric properties and leakage current behavior in CaCu3Ti4O12 (CCTO) films with different thickness are studied. It is found that the permittivity is affected simultaneously by the electrode interface and the microstructure of the film. The influence of the interfacial layer reduces and the ac electric process transfers from grain boundary to bulk conductivity relaxation with the film thickness increasing. The Poole-Frenkel emission is dominated in thicker CCTO film. Interface-related conductive process coexists with the bulk-limited process in thinner film.

AB - Dielectric properties and leakage current behavior in CaCu3Ti4O12 (CCTO) films with different thickness are studied. It is found that the permittivity is affected simultaneously by the electrode interface and the microstructure of the film. The influence of the interfacial layer reduces and the ac electric process transfers from grain boundary to bulk conductivity relaxation with the film thickness increasing. The Poole-Frenkel emission is dominated in thicker CCTO film. Interface-related conductive process coexists with the bulk-limited process in thinner film.

KW - Dielectrics

KW - Electrical properties

KW - Sol-gel

UR - https://www.scopus.com/pages/publications/65749116014

U2 - 10.1016/j.physleta.2009.05.001

DO - 10.1016/j.physleta.2009.05.001

M3 - 文章

AN - SCOPUS:65749116014

SN - 0375-9601

VL - 373

SP - 2389

EP - 2392

JO - Physics Letters, Section A: General, Atomic and Solid State Physics

JF - Physics Letters, Section A: General, Atomic and Solid State Physics

IS - 27-28

ER -

Effect of thickness on the dielectric property and nonlinear current-voltage behavior of CaCu₃Ti₄O₁₂ thin films

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Keywords

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