Effect of hydrolysis on properties of PbZr0.50Ti0.50O3 ferroelectric thin films derived from a modified sol-gel process

G. S. Wang; X. J. Meng; J. Yu; J. L. Sun; Z. Q. Lai; S. L. Guo; J. H. Chu

doi:10.1016/S0022-0248(01)01541-X

Effect of hydrolysis on properties of PbZr_0.50Ti_0.50O₃ ferroelectric thin films derived from a modified sol-gel process

G. S. Wang^*
, X. J. Meng
, J. Yu
, J. L. Sun
, Z. Q. Lai
, S. L. Guo
, J. H. Chu

^*Corresponding author for this work

CAS - Shanghai Institute of Technical Physics

Research output: Contribution to journal › Article › peer-review

7 Scopus citations

Abstract

Lead zirconate titanate PbZr_0.50Ti_0.50O₃ (PZT) ferroelectric thin films were successfully deposited on Pt(111)/Ti/SiO₂/Si substrates by a modified sol-gel method using zirconium nitrate as a substitute for the conventional zirconium alkoxide. The precursor solutions were hydrolyzed with different H₂O/Pb ratios. The effect of hydrolysis ratios of the solution on the microstructure for the PZT thin films were investigated via X-ray diffraction (XRD) and atomic force microscopy (AFM) techniques. The XRD results show that the PZT films exhibit (111)-orientation and the degree of the (111)-orientation decreases with the increase of hydrolysis ratio. These results indicate that the ferroelectric behavior can be improved by an appropriate choice of H₂O/Pb ratio.

Original language	English
Pages (from-to)	269-274
Number of pages	6
Journal	Journal of Crystal Growth
Volume	233
Issue number	1-2
DOIs	https://doi.org/10.1016/S0022-0248(01)01541-X
State	Published - Nov 2001
Externally published	Yes

Keywords

A1. X-ray diffraction
B1. perovskites
B2. ferroelectric materials

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10.1016/S0022-0248(01)01541-X

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@article{61c1f537f7b845eaa5d500b711f7eb8d,

title = "Effect of hydrolysis on properties of PbZr0.50Ti0.50O3 ferroelectric thin films derived from a modified sol-gel process",

abstract = "Lead zirconate titanate PbZr0.50Ti0.50O3 (PZT) ferroelectric thin films were successfully deposited on Pt(111)/Ti/SiO2/Si substrates by a modified sol-gel method using zirconium nitrate as a substitute for the conventional zirconium alkoxide. The precursor solutions were hydrolyzed with different H2O/Pb ratios. The effect of hydrolysis ratios of the solution on the microstructure for the PZT thin films were investigated via X-ray diffraction (XRD) and atomic force microscopy (AFM) techniques. The XRD results show that the PZT films exhibit (111)-orientation and the degree of the (111)-orientation decreases with the increase of hydrolysis ratio. These results indicate that the ferroelectric behavior can be improved by an appropriate choice of H2O/Pb ratio.",

keywords = "A1. X-ray diffraction, B1. perovskites, B2. ferroelectric materials",

author = "Wang, \{G. S.\} and Meng, \{X. J.\} and J. Yu and Sun, \{J. L.\} and Lai, \{Z. Q.\} and Guo, \{S. L.\} and Chu, \{J. H.\}",

year = "2001",

month = nov,

doi = "10.1016/S0022-0248(01)01541-X",

language = "英语",

volume = "233",

pages = "269--274",

journal = "Journal of Crystal Growth",

issn = "0022-0248",

publisher = "Elsevier B.V.",

number = "1-2",

}

TY - JOUR

T1 - Effect of hydrolysis on properties of PbZr0.50Ti0.50O3 ferroelectric thin films derived from a modified sol-gel process

AU - Wang, G. S.

AU - Meng, X. J.

AU - Yu, J.

AU - Sun, J. L.

AU - Lai, Z. Q.

AU - Guo, S. L.

AU - Chu, J. H.

PY - 2001/11

Y1 - 2001/11

N2 - Lead zirconate titanate PbZr0.50Ti0.50O3 (PZT) ferroelectric thin films were successfully deposited on Pt(111)/Ti/SiO2/Si substrates by a modified sol-gel method using zirconium nitrate as a substitute for the conventional zirconium alkoxide. The precursor solutions were hydrolyzed with different H2O/Pb ratios. The effect of hydrolysis ratios of the solution on the microstructure for the PZT thin films were investigated via X-ray diffraction (XRD) and atomic force microscopy (AFM) techniques. The XRD results show that the PZT films exhibit (111)-orientation and the degree of the (111)-orientation decreases with the increase of hydrolysis ratio. These results indicate that the ferroelectric behavior can be improved by an appropriate choice of H2O/Pb ratio.

AB - Lead zirconate titanate PbZr0.50Ti0.50O3 (PZT) ferroelectric thin films were successfully deposited on Pt(111)/Ti/SiO2/Si substrates by a modified sol-gel method using zirconium nitrate as a substitute for the conventional zirconium alkoxide. The precursor solutions were hydrolyzed with different H2O/Pb ratios. The effect of hydrolysis ratios of the solution on the microstructure for the PZT thin films were investigated via X-ray diffraction (XRD) and atomic force microscopy (AFM) techniques. The XRD results show that the PZT films exhibit (111)-orientation and the degree of the (111)-orientation decreases with the increase of hydrolysis ratio. These results indicate that the ferroelectric behavior can be improved by an appropriate choice of H2O/Pb ratio.

KW - A1. X-ray diffraction

KW - B1. perovskites

KW - B2. ferroelectric materials

UR - https://www.scopus.com/pages/publications/0035502136

U2 - 10.1016/S0022-0248(01)01541-X

DO - 10.1016/S0022-0248(01)01541-X

M3 - 文章

AN - SCOPUS:0035502136

SN - 0022-0248

VL - 233

SP - 269

EP - 274

JO - Journal of Crystal Growth

JF - Journal of Crystal Growth

IS - 1-2

ER -

Effect of hydrolysis on properties of PbZr_0.50Ti_0.50O₃ ferroelectric thin films derived from a modified sol-gel process

Abstract

Keywords

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