Effect of etching temperature on the growth of silicon nanowires

  • Yanli Liu
  • , Jian Zhang*
  • *Corresponding author for this work

Research output: Chapter in Book/Report/Conference proceedingConference contributionpeer-review

4 Scopus citations

Abstract

The effects of different etching temperatures (near room temperature) on the length and surface morphology of SiNWs were reported in this paper. The studies on temperature dependence of SiNWs growth rate were carried out at 20 °C, 30 °C, 40 °C, 50 °C, 60 °C, and 70 °C for n-type and p-type substrates. The results suggested that the SiNWs length could be controlled easily by the change of the etching temperature. Superlong SiNWs were also fabricated by this technique. The superlong SiNWs had the length more than 400 μm and the aspect ratios were about 2000-20000, which could be applied in nanosensors and interconnection.

Original languageEnglish
Title of host publicationApplied Mechanics and Mechanical Engineering II
PublisherTrans Tech Publications Ltd
Pages1082-1088
Number of pages7
ISBN (Print)9783037852965
DOIs
StatePublished - 2012
Event2011 2nd International Conference on Applied Mechanics and Mechanical Engineering, ICAMME 2011 - Sanya, China
Duration: 8 Oct 20119 Oct 2011

Publication series

NameApplied Mechanics and Materials
Volume138-139
ISSN (Print)1660-9336
ISSN (Electronic)1662-7482

Conference

Conference2011 2nd International Conference on Applied Mechanics and Mechanical Engineering, ICAMME 2011
Country/TerritoryChina
CitySanya
Period8/10/119/10/11

Keywords

  • Length
  • Silicon nanowires
  • Surface morphology
  • Temperature

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