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Dual Pseudo-Labels Interactive Self-Training for Semi-Supervised Visible-Infrared Person Re-Identification

  • Jiangming Shi
  • , Yachao Zhang
  • , Xiangbo Yin
  • , Yuan Xie
  • , Zhizhong Zhang
  • , Jianping Fan
  • , Zhongchao Shi
  • , Yanyun Qu*
  • *Corresponding author for this work
  • Institute of Artificial Intelligence
  • Tsinghua University
  • Xiamen University
  • Lenovo

Research output: Chapter in Book/Report/Conference proceedingConference contributionpeer-review

Abstract

Visible-infrared person re-identification (VI-ReID) aims to match a specific person from a gallery of images captured from non-overlapping visible and infrared cameras. Most works focus on fully supervised VI-ReID, which requires substantial cross-modality annotation that is more expensive than the annotation in single-modality. To reduce the extensive cost of annotation, we explore two practical semi-supervised settings: uni-semi-supervised (annotating only visible images) and bi-semi-supervised (annotating partially in both modalities). These two semi-supervised settings face two challenges due to the large cross-modality discrepancies and the lack of correspondence supervision between visible and infrared images. Thus, it is diffi-cult to generate reliable pseudo-labels and learn modality-invariant features from noise pseudo-labels. In this paper, we propose a dual pseudo-label interactive self-training (DPIS) for these two semi-supervised VI-ReID. Our DPIS integrates two pseudo-labels generated by distinct models into a hybrid pseudo-label for unlabeled data. However, the hybrid pseudo-label still inevitably contains noise. To eliminate the negative effect of noise pseudo-labels, we introduce three modules: noise label penalty (NLP), noise correspondence calibration (NCC), and unreliable anchor learning (UAL). Specifically, NLP penalizes noise labels, NCC calibrates noisy correspondences, and UAL mines the hard-to-discriminate features. Extensive experimental results on SYSU-MM01 and RegDB demonstrate that our DPIS achieves impressive performance under these two semi-supervised settings.

Original languageEnglish
Title of host publicationProceedings - 2023 IEEE/CVF International Conference on Computer Vision, ICCV 2023
PublisherInstitute of Electrical and Electronics Engineers Inc.
Pages11184-11194
Number of pages11
ISBN (Electronic)9798350307184
DOIs
StatePublished - 2023
Event2023 IEEE/CVF International Conference on Computer Vision, ICCV 2023 - Paris, France
Duration: 2 Oct 20236 Oct 2023

Publication series

NameProceedings of the IEEE International Conference on Computer Vision
ISSN (Print)1550-5499

Conference

Conference2023 IEEE/CVF International Conference on Computer Vision, ICCV 2023
Country/TerritoryFrance
CityParis
Period2/10/236/10/23

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