Distinguishing the effect of crystal-field screening from the effect of valence recharging on the 2p 3/2 and 3d 5/2 level energies of nanostructured copper

Chang Q. Sun*, L. K. Pan, T. P. Chen, X. W. Sun, S. Li, C. M. Li

*Corresponding author for this work

Research output: Contribution to journalArticlepeer-review

14 Scopus citations

Abstract

Incorporating the recent bond order-length-strength correlation mechanism [C.Q. Sun, Phys. Rev. B 69 (2004) 045105] to the size dependence of Auger photoelectron coincidence spectra of Cu nanoparticles with and without being passivated has enabled us to gain quantitative information about the 2p and 3d level energies of an isolated Cu atom and their shift upon bulk formation. The developed approach also enabled us to discriminate the effect of crystal-field screening from the effect of valence recharging (due to surface passivation and substrate-particle interaction) on the binding energies to the electrons at different energy levels of a specimen.

Original languageEnglish
Pages (from-to)2101-2107
Number of pages7
JournalApplied Surface Science
Volume252
Issue number6
DOIs
StatePublished - 15 Jan 2006
Externally publishedYes

Keywords

  • Chemical reaction
  • Copper
  • Core level energy
  • Crystal binding
  • Nanostructures
  • Surface bond contraction

Fingerprint

Dive into the research topics of 'Distinguishing the effect of crystal-field screening from the effect of valence recharging on the 2p 3/2 and 3d 5/2 level energies of nanostructured copper'. Together they form a unique fingerprint.

Cite this