DISS: A Novel Data Invalidation Scheme for Swap-Data on Flash Storage Systems

Dingcui Yu, Longfei Luo, Han Wang, Yina Lv, Liang Shi

Research output: Chapter in Book/Report/Conference proceedingConference contributionpeer-review

Abstract

Storage swapping has been a critical technique used to relieve memory pressure and improve user experience. However, it generates lots of data writes in flash storage, deteriorating the lifetime and performance. In this paper, inspired by empirical studies on swap data access characteristics, we propose a novel data invalidation scheme, namely DISS, which includes two methods. First, a cross-layer swap-data invalidation method is proposed to invalidate swapped-in data at a low cost. Second, a swap data separation method is proposed to schedule swap data and file-backed data into different places. Experimental results show that DISS achieves encouraging flash lifetime and performance optimization.

Original languageEnglish
Title of host publicationASP-DAC 2025 - 30th Asia and South Pacific Design Automation Conference, Proceedings
PublisherInstitute of Electrical and Electronics Engineers Inc.
Pages1153-1159
Number of pages7
ISBN (Electronic)9798400706356
DOIs
StatePublished - 4 Mar 2025
Event30th Asia and South Pacific Design Automation Conference, ASP-DAC 2025 - Tokyo, Japan
Duration: 20 Jan 202523 Jan 2025

Publication series

NameProceedings of the Asia and South Pacific Design Automation Conference, ASP-DAC
ISSN (Print)2153-6961
ISSN (Electronic)2153-697X

Conference

Conference30th Asia and South Pacific Design Automation Conference, ASP-DAC 2025
Country/TerritoryJapan
CityTokyo
Period20/01/2523/01/25

Keywords

  • flash storage
  • lifetime
  • swap
  • trim

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