Direct synthesis and characterization of Ti-containing mesoporous silica thin films

Zi Le Hua; Jian Lin Shi; Wen Hua Zhang; Wei Min Huang

doi:10.1016/S0167-577X(01)00497-9

Direct synthesis and characterization of Ti-containing mesoporous silica thin films

Zi Le Hua, Jian Lin Shi^*, Wen Hua Zhang, Wei Min Huang

^*Corresponding author for this work

CAS - Shanghai Institute of Ceramics

Research output: Contribution to journal › Article › peer-review

10 Scopus citations

Abstract

Using acetylacetone as the hydrolysis-retarding agent, titanium has been directly incorporated into mesoporous silica thin films by a dip-coating method for the first time. Evidence from the ultraviolet-visible (UV-Vis) absorbance spectra, high-resolution electron microscopy (HREM), energy dispersion spectrum (EDS) and electron probe X-ray microanalysis (EPMA) indicated that Ti atoms were homogeneously dispersed in the siliceous framework and existed in the form of a Ti-O-Si bond. The increase of the film's basal spacing accompanied with an increase of Ti content was also observed.

Original language	English
Pages (from-to)	299-304
Number of pages	6
Journal	Materials Letters
Volume	53
Issue number	4-5
DOIs	https://doi.org/10.1016/S0167-577X(01)00497-9
State	Published - Apr 2002
Externally published	Yes

Keywords

Acetylacetone
Direct synthesis
Mesoporous silica thin films
Titanium
UV-Vis spectra

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10.1016/S0167-577X(01)00497-9

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@article{fb0f36ced703456889d1eda2adb1a5ad,

title = "Direct synthesis and characterization of Ti-containing mesoporous silica thin films",

abstract = "Using acetylacetone as the hydrolysis-retarding agent, titanium has been directly incorporated into mesoporous silica thin films by a dip-coating method for the first time. Evidence from the ultraviolet-visible (UV-Vis) absorbance spectra, high-resolution electron microscopy (HREM), energy dispersion spectrum (EDS) and electron probe X-ray microanalysis (EPMA) indicated that Ti atoms were homogeneously dispersed in the siliceous framework and existed in the form of a Ti-O-Si bond. The increase of the film's basal spacing accompanied with an increase of Ti content was also observed.",

keywords = "Acetylacetone, Direct synthesis, Mesoporous silica thin films, Titanium, UV-Vis spectra",

author = "Hua, \{Zi Le\} and Shi, \{Jian Lin\} and Zhang, \{Wen Hua\} and Huang, \{Wei Min\}",

year = "2002",

month = apr,

doi = "10.1016/S0167-577X(01)00497-9",

language = "英语",

volume = "53",

pages = "299--304",

journal = "Materials Letters",

issn = "0167-577X",

publisher = "Elsevier B.V.",

number = "4-5",

}

TY - JOUR

T1 - Direct synthesis and characterization of Ti-containing mesoporous silica thin films

AU - Hua, Zi Le

AU - Shi, Jian Lin

AU - Zhang, Wen Hua

AU - Huang, Wei Min

PY - 2002/4

Y1 - 2002/4

N2 - Using acetylacetone as the hydrolysis-retarding agent, titanium has been directly incorporated into mesoporous silica thin films by a dip-coating method for the first time. Evidence from the ultraviolet-visible (UV-Vis) absorbance spectra, high-resolution electron microscopy (HREM), energy dispersion spectrum (EDS) and electron probe X-ray microanalysis (EPMA) indicated that Ti atoms were homogeneously dispersed in the siliceous framework and existed in the form of a Ti-O-Si bond. The increase of the film's basal spacing accompanied with an increase of Ti content was also observed.

AB - Using acetylacetone as the hydrolysis-retarding agent, titanium has been directly incorporated into mesoporous silica thin films by a dip-coating method for the first time. Evidence from the ultraviolet-visible (UV-Vis) absorbance spectra, high-resolution electron microscopy (HREM), energy dispersion spectrum (EDS) and electron probe X-ray microanalysis (EPMA) indicated that Ti atoms were homogeneously dispersed in the siliceous framework and existed in the form of a Ti-O-Si bond. The increase of the film's basal spacing accompanied with an increase of Ti content was also observed.

KW - Acetylacetone

KW - Direct synthesis

KW - Mesoporous silica thin films

KW - Titanium

KW - UV-Vis spectra

UR - https://www.scopus.com/pages/publications/0036533694

U2 - 10.1016/S0167-577X(01)00497-9

DO - 10.1016/S0167-577X(01)00497-9

M3 - 文章

AN - SCOPUS:0036533694

SN - 0167-577X

VL - 53

SP - 299

EP - 304

JO - Materials Letters

JF - Materials Letters

IS - 4-5

ER -

Direct synthesis and characterization of Ti-containing mesoporous silica thin films

Abstract

Keywords

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