Dielectric relaxation in layer-structured SrBi2-xNd xNb2O9 ceramics (x = 0, 0.05, 0.2, 0.35)

Lin Sun; Chude Feng; Lidong Chen; Shiming Huang

doi:10.1111/j.1551-2916.2006.01405.x

Dielectric relaxation in layer-structured SrBi_2-xNd _xNb₂O₉ ceramics (x = 0, 0.05, 0.2, 0.35)

Lin Sun
, Chude Feng^*
, Lidong Chen
, Shiming Huang

^*Corresponding author for this work

CAS - Shanghai Institute of Ceramics
University of Chinese Academy of Sciences
Tongji University

Research output: Contribution to journal › Article › peer-review

26 Scopus citations

Abstract

SrBi_2-xNd_xNb₂O₉ (x = 0, 0.05, 0.2, 0.35) ceramics were synthesized by the traditional solid-state sintering method. X-ray diffraction analysis showed that single-phase-layered perovskites were obtained for all compositions. The substitution of Nd³⁺ for Bi³⁺ induced a relaxor behavior of frequency dispersion for Nd-doped SrBi₂Nb₂O₉.The parameter of frequency dispersion ΔT_m, which is the T_m between 1 kHz and 1 MHz, increases from 0°C for x = 0 to 13°C for x = 0.35, and the degree of relaxor behavior γ increases from 0.96 for x = 0 to 2.02 for x = 0.35. The temperature of the maximum dielectric constant T_m decreases linearly with an increase in the Nd content (x).

Original language	English
Pages (from-to)	322-326
Number of pages	5
Journal	Journal of the American Ceramic Society
Volume	90
Issue number	1
DOIs	https://doi.org/10.1111/j.1551-2916.2006.01405.x
State	Published - Jan 2007
Externally published	Yes

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title = "Dielectric relaxation in layer-structured SrBi2-xNd xNb2O9 ceramics (x = 0, 0.05, 0.2, 0.35)",

abstract = "SrBi2-xNdxNb2O9 (x = 0, 0.05, 0.2, 0.35) ceramics were synthesized by the traditional solid-state sintering method. X-ray diffraction analysis showed that single-phase-layered perovskites were obtained for all compositions. The substitution of Nd3+ for Bi3+ induced a relaxor behavior of frequency dispersion for Nd-doped SrBi2Nb2O9.The parameter of frequency dispersion ΔTm, which is the Tm between 1 kHz and 1 MHz, increases from 0°C for x = 0 to 13°C for x = 0.35, and the degree of relaxor behavior γ increases from 0.96 for x = 0 to 2.02 for x = 0.35. The temperature of the maximum dielectric constant Tm decreases linearly with an increase in the Nd content (x).",

author = "Lin Sun and Chude Feng and Lidong Chen and Shiming Huang",

year = "2007",

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doi = "10.1111/j.1551-2916.2006.01405.x",

language = "英语",

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journal = "Journal of the American Ceramic Society",

issn = "0002-7820",

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T1 - Dielectric relaxation in layer-structured SrBi2-xNd xNb2O9 ceramics (x = 0, 0.05, 0.2, 0.35)

AU - Sun, Lin

AU - Feng, Chude

AU - Chen, Lidong

AU - Huang, Shiming

PY - 2007/1

Y1 - 2007/1

N2 - SrBi2-xNdxNb2O9 (x = 0, 0.05, 0.2, 0.35) ceramics were synthesized by the traditional solid-state sintering method. X-ray diffraction analysis showed that single-phase-layered perovskites were obtained for all compositions. The substitution of Nd3+ for Bi3+ induced a relaxor behavior of frequency dispersion for Nd-doped SrBi2Nb2O9.The parameter of frequency dispersion ΔTm, which is the Tm between 1 kHz and 1 MHz, increases from 0°C for x = 0 to 13°C for x = 0.35, and the degree of relaxor behavior γ increases from 0.96 for x = 0 to 2.02 for x = 0.35. The temperature of the maximum dielectric constant Tm decreases linearly with an increase in the Nd content (x).

AB - SrBi2-xNdxNb2O9 (x = 0, 0.05, 0.2, 0.35) ceramics were synthesized by the traditional solid-state sintering method. X-ray diffraction analysis showed that single-phase-layered perovskites were obtained for all compositions. The substitution of Nd3+ for Bi3+ induced a relaxor behavior of frequency dispersion for Nd-doped SrBi2Nb2O9.The parameter of frequency dispersion ΔTm, which is the Tm between 1 kHz and 1 MHz, increases from 0°C for x = 0 to 13°C for x = 0.35, and the degree of relaxor behavior γ increases from 0.96 for x = 0 to 2.02 for x = 0.35. The temperature of the maximum dielectric constant Tm decreases linearly with an increase in the Nd content (x).

UR - https://www.scopus.com/pages/publications/33846177255

U2 - 10.1111/j.1551-2916.2006.01405.x

DO - 10.1111/j.1551-2916.2006.01405.x

M3 - 文章

AN - SCOPUS:33846177255

SN - 0002-7820

VL - 90

SP - 322

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JO - Journal of the American Ceramic Society

JF - Journal of the American Ceramic Society

IS - 1

ER -

Dielectric relaxation in layer-structured SrBi_2-xNd _xNb₂O₉ ceramics (x = 0, 0.05, 0.2, 0.35)

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