TY - JOUR
T1 - Dielectric relaxation in layer-structured SrBi2-xNd xNb2O9 ceramics (x = 0, 0.05, 0.2, 0.35)
AU - Sun, Lin
AU - Feng, Chude
AU - Chen, Lidong
AU - Huang, Shiming
PY - 2007/1
Y1 - 2007/1
N2 - SrBi2-xNdxNb2O9 (x = 0, 0.05, 0.2, 0.35) ceramics were synthesized by the traditional solid-state sintering method. X-ray diffraction analysis showed that single-phase-layered perovskites were obtained for all compositions. The substitution of Nd3+ for Bi3+ induced a relaxor behavior of frequency dispersion for Nd-doped SrBi2Nb2O9.The parameter of frequency dispersion ΔTm, which is the Tm between 1 kHz and 1 MHz, increases from 0°C for x = 0 to 13°C for x = 0.35, and the degree of relaxor behavior γ increases from 0.96 for x = 0 to 2.02 for x = 0.35. The temperature of the maximum dielectric constant Tm decreases linearly with an increase in the Nd content (x).
AB - SrBi2-xNdxNb2O9 (x = 0, 0.05, 0.2, 0.35) ceramics were synthesized by the traditional solid-state sintering method. X-ray diffraction analysis showed that single-phase-layered perovskites were obtained for all compositions. The substitution of Nd3+ for Bi3+ induced a relaxor behavior of frequency dispersion for Nd-doped SrBi2Nb2O9.The parameter of frequency dispersion ΔTm, which is the Tm between 1 kHz and 1 MHz, increases from 0°C for x = 0 to 13°C for x = 0.35, and the degree of relaxor behavior γ increases from 0.96 for x = 0 to 2.02 for x = 0.35. The temperature of the maximum dielectric constant Tm decreases linearly with an increase in the Nd content (x).
UR - https://www.scopus.com/pages/publications/33846177255
U2 - 10.1111/j.1551-2916.2006.01405.x
DO - 10.1111/j.1551-2916.2006.01405.x
M3 - 文章
AN - SCOPUS:33846177255
SN - 0002-7820
VL - 90
SP - 322
EP - 326
JO - Journal of the American Ceramic Society
JF - Journal of the American Ceramic Society
IS - 1
ER -