Abstract
Dielectric behavior of PbZr0.38Ti0.62O3 multilayer with alternating dense and porous PbZr0.38Ti0.62O3 layers was investigated at 420K. Two distinct dielectric relaxation processes were observed in the frequency range from 102 Hz to 106 Hz. The relaxation at lower frequencies is attributed to the space charge polarization. The one at higher frequencies, with a thermal activation energy of 0.49 eV, might originate from the response of singly positive charged defect dipoles V̈0-Ti3+ to ac electric fields. These dipoles are formed by the doubly ionized oxygen vacancies V0 and trivalent titanium ions Ti3+ as indicated by the results of Auger electron spectrum and electron paramagnetic resonance spectrum.
| Original language | English |
|---|---|
| Pages (from-to) | 321-324+329 |
| Journal | Hongwai Yu Haomibo Xuebao/Journal of Infrared and Millimeter Waves |
| Volume | 28 |
| Issue number | 5 |
| DOIs | |
| State | Published - Oct 2009 |
| Externally published | Yes |
Keywords
- Dielectric relaxation
- Dipolar defect complex
- PbZrTiO multilayer
Fingerprint
Dive into the research topics of 'Dielectric relaxation associated with dipolar defect complex in PbZrxTi1-xO3 multilayer'. Together they form a unique fingerprint.Cite this
- APA
- Author
- BIBTEX
- Harvard
- Standard
- RIS
- Vancouver