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Dielectric relaxation associated with dipolar defect complex in PbZrxTi1-xO3 multilayer

  • Gu Jin Hu*
  • , Ting Zhang
  • , Jing Lan Sun
  • , Da Ming Zhu
  • , Jun Hao Chu
  • , Ning Dai
  • *Corresponding author for this work
  • CAS - Shanghai Institute of Technical Physics
  • University of Missouri at Kansas City

Research output: Contribution to journalArticlepeer-review

Abstract

Dielectric behavior of PbZr0.38Ti0.62O3 multilayer with alternating dense and porous PbZr0.38Ti0.62O3 layers was investigated at 420K. Two distinct dielectric relaxation processes were observed in the frequency range from 102 Hz to 106 Hz. The relaxation at lower frequencies is attributed to the space charge polarization. The one at higher frequencies, with a thermal activation energy of 0.49 eV, might originate from the response of singly positive charged defect dipoles V̈0-Ti3+ to ac electric fields. These dipoles are formed by the doubly ionized oxygen vacancies V0 and trivalent titanium ions Ti3+ as indicated by the results of Auger electron spectrum and electron paramagnetic resonance spectrum.

Original languageEnglish
Pages (from-to)321-324+329
JournalHongwai Yu Haomibo Xuebao/Journal of Infrared and Millimeter Waves
Volume28
Issue number5
DOIs
StatePublished - Oct 2009
Externally publishedYes

Keywords

  • Dielectric relaxation
  • Dipolar defect complex
  • PbZrTiO multilayer

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