Dielectric properties of SrBi2Ta2O9 films in the low-temperature range

Pingxiong Yang; Ming Guo; Meirong Shi

doi:10.1007/s10853-005-3684-y

Dielectric properties of SrBi₂Ta₂O₉ films in the low-temperature range

Pingxiong Yang^*
, Ming Guo
, Meirong Shi

^*Corresponding author for this work

School of Physics and Electronic Science

East China Normal University

Research output: Contribution to journal › Article › peer-review

4 Scopus citations

Abstract

The dielectric properties and the voltage tunability of SrBi ₂Ta₂O₉ thin films in the low temperature range of 10-300 K, were investigated. The crystallographic structure of the SBT thin films was characterized by X-ray diffraction (XRD) and the microstructure of the films was observed by atomic force microscopy (AFM). The origin of temperature effect of tunability may arise from switchable polarization that are frozen at low temperature which suppress magnitude of capacitance peaks. The results show that SBT films are promising materials for application in electrically tunable microwave devices.

Original language	English
Pages (from-to)	6329-6331
Number of pages	3
Journal	Journal of Materials Science
Volume	40
Issue number	23
DOIs	https://doi.org/10.1007/s10853-005-3684-y
State	Published - Dec 2005

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@article{fb8c9b0d1d8a4d8994ae1715f3c999c6,

title = "Dielectric properties of SrBi2Ta2O9 films in the low-temperature range",

abstract = "The dielectric properties and the voltage tunability of SrBi 2Ta2O9 thin films in the low temperature range of 10-300 K, were investigated. The crystallographic structure of the SBT thin films was characterized by X-ray diffraction (XRD) and the microstructure of the films was observed by atomic force microscopy (AFM). The origin of temperature effect of tunability may arise from switchable polarization that are frozen at low temperature which suppress magnitude of capacitance peaks. The results show that SBT films are promising materials for application in electrically tunable microwave devices.",

author = "Pingxiong Yang and Ming Guo and Meirong Shi",

year = "2005",

month = dec,

doi = "10.1007/s10853-005-3684-y",

language = "英语",

volume = "40",

pages = "6329--6331",

journal = "Journal of Materials Science",

issn = "0022-2461",

publisher = "Springer",

number = "23",

}

TY - JOUR

T1 - Dielectric properties of SrBi2Ta2O9 films in the low-temperature range

AU - Yang, Pingxiong

AU - Guo, Ming

AU - Shi, Meirong

PY - 2005/12

Y1 - 2005/12

N2 - The dielectric properties and the voltage tunability of SrBi 2Ta2O9 thin films in the low temperature range of 10-300 K, were investigated. The crystallographic structure of the SBT thin films was characterized by X-ray diffraction (XRD) and the microstructure of the films was observed by atomic force microscopy (AFM). The origin of temperature effect of tunability may arise from switchable polarization that are frozen at low temperature which suppress magnitude of capacitance peaks. The results show that SBT films are promising materials for application in electrically tunable microwave devices.

AB - The dielectric properties and the voltage tunability of SrBi 2Ta2O9 thin films in the low temperature range of 10-300 K, were investigated. The crystallographic structure of the SBT thin films was characterized by X-ray diffraction (XRD) and the microstructure of the films was observed by atomic force microscopy (AFM). The origin of temperature effect of tunability may arise from switchable polarization that are frozen at low temperature which suppress magnitude of capacitance peaks. The results show that SBT films are promising materials for application in electrically tunable microwave devices.

UR - https://www.scopus.com/pages/publications/30744462070

U2 - 10.1007/s10853-005-3684-y

DO - 10.1007/s10853-005-3684-y

M3 - 文章

AN - SCOPUS:30744462070

SN - 0022-2461

VL - 40

SP - 6329

EP - 6331

JO - Journal of Materials Science

JF - Journal of Materials Science

IS - 23

ER -

Dielectric properties of SrBi₂Ta₂O₉ films in the low-temperature range

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