Dielectric functions of La-based cuprate superconductors for visible and near-infrared wavelengths

Minglin Zhao; Jie Lian; Heshan Yu; Kui Jin; Liping Xu; Zhigao Hu; Xiulun Yang; Shishou Kang

doi:10.1016/j.apsusc.2016.10.055

Dielectric functions of La-based cuprate superconductors for visible and near-infrared wavelengths

Minglin Zhao
, Jie Lian^*
, Heshan Yu
, Kui Jin
, Liping Xu
, Zhigao Hu
, Xiulun Yang
, Shishou Kang

^*Corresponding author for this work

School of Physics and Electronic Science

Research output: Contribution to journal › Article › peer-review

12 Scopus citations

Abstract

The highly c-axis oriented La _1.9 Ce _0.1 CuO ₄ (LCCO) film was prepared on SrTiO ₃ (STO) substrate by pulsed-laser deposition (PLD). The identification and characterization of the LCCO film was determined by X-ray diffraction (XRD), atomic force microscopy (AFM), scanning electron microscope (SEM) and X-ray photoelectron spectroscopy (XPS). Spectroscopic ellipsometry (SE) measurement was performed on the LCCO film in 0.5–4.13 eV range. The complex pseudodielectric function of the LCCO film was reported by Drude and Lorentz oscillators in this work. Critical point analysis on third-derivative spectra of the Lorentz contributions was accomplished to obtain the interband transition energies. The results indicate that the interband transitions are mainly related to the copper-oxygen planes. The metallic behavior of the pseudodielectric function, which is a common feature in all known electron-doped superconductors, can be obviously observed in the LCCO film.

Original language	English
Pages (from-to)	611-616
Number of pages	6
Journal	Applied Surface Science
Volume	421
DOIs	https://doi.org/10.1016/j.apsusc.2016.10.055
State	Published - 1 Nov 2017

Keywords

Dielectric function
Ellipsometry
N-type superconductor
XPS

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10.1016/j.apsusc.2016.10.055

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@article{72212a911c9a4fa184b02facbfac0d0b,

title = "Dielectric functions of La-based cuprate superconductors for visible and near-infrared wavelengths",

abstract = " The highly c-axis oriented La 1.9 Ce 0.1 CuO 4 (LCCO) film was prepared on SrTiO 3 (STO) substrate by pulsed-laser deposition (PLD). The identification and characterization of the LCCO film was determined by X-ray diffraction (XRD), atomic force microscopy (AFM), scanning electron microscope (SEM) and X-ray photoelectron spectroscopy (XPS). Spectroscopic ellipsometry (SE) measurement was performed on the LCCO film in 0.5–4.13 eV range. The complex pseudodielectric function of the LCCO film was reported by Drude and Lorentz oscillators in this work. Critical point analysis on third-derivative spectra of the Lorentz contributions was accomplished to obtain the interband transition energies. The results indicate that the interband transitions are mainly related to the copper-oxygen planes. The metallic behavior of the pseudodielectric function, which is a common feature in all known electron-doped superconductors, can be obviously observed in the LCCO film.",

keywords = "Dielectric function, Ellipsometry, N-type superconductor, XPS",

author = "Minglin Zhao and Jie Lian and Heshan Yu and Kui Jin and Liping Xu and Zhigao Hu and Xiulun Yang and Shishou Kang",

note = "Publisher Copyright: {\textcopyright} 2016 Elsevier B.V.",

year = "2017",

month = nov,

day = "1",

doi = "10.1016/j.apsusc.2016.10.055",

language = "英语",

volume = "421",

pages = "611--616",

journal = "Applied Surface Science",

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TY - JOUR

T1 - Dielectric functions of La-based cuprate superconductors for visible and near-infrared wavelengths

AU - Zhao, Minglin

AU - Lian, Jie

AU - Yu, Heshan

AU - Jin, Kui

AU - Xu, Liping

AU - Hu, Zhigao

AU - Yang, Xiulun

AU - Kang, Shishou

PY - 2017/11/1

Y1 - 2017/11/1

N2 - The highly c-axis oriented La 1.9 Ce 0.1 CuO 4 (LCCO) film was prepared on SrTiO 3 (STO) substrate by pulsed-laser deposition (PLD). The identification and characterization of the LCCO film was determined by X-ray diffraction (XRD), atomic force microscopy (AFM), scanning electron microscope (SEM) and X-ray photoelectron spectroscopy (XPS). Spectroscopic ellipsometry (SE) measurement was performed on the LCCO film in 0.5–4.13 eV range. The complex pseudodielectric function of the LCCO film was reported by Drude and Lorentz oscillators in this work. Critical point analysis on third-derivative spectra of the Lorentz contributions was accomplished to obtain the interband transition energies. The results indicate that the interband transitions are mainly related to the copper-oxygen planes. The metallic behavior of the pseudodielectric function, which is a common feature in all known electron-doped superconductors, can be obviously observed in the LCCO film.

AB - The highly c-axis oriented La 1.9 Ce 0.1 CuO 4 (LCCO) film was prepared on SrTiO 3 (STO) substrate by pulsed-laser deposition (PLD). The identification and characterization of the LCCO film was determined by X-ray diffraction (XRD), atomic force microscopy (AFM), scanning electron microscope (SEM) and X-ray photoelectron spectroscopy (XPS). Spectroscopic ellipsometry (SE) measurement was performed on the LCCO film in 0.5–4.13 eV range. The complex pseudodielectric function of the LCCO film was reported by Drude and Lorentz oscillators in this work. Critical point analysis on third-derivative spectra of the Lorentz contributions was accomplished to obtain the interband transition energies. The results indicate that the interband transitions are mainly related to the copper-oxygen planes. The metallic behavior of the pseudodielectric function, which is a common feature in all known electron-doped superconductors, can be obviously observed in the LCCO film.

KW - Dielectric function

KW - Ellipsometry

KW - N-type superconductor

KW - XPS

UR - https://www.scopus.com/pages/publications/85006100256

U2 - 10.1016/j.apsusc.2016.10.055

DO - 10.1016/j.apsusc.2016.10.055

M3 - 文章

AN - SCOPUS:85006100256

SN - 0169-4332

VL - 421

SP - 611

EP - 616

JO - Applied Surface Science

JF - Applied Surface Science

ER -

Dielectric functions of La-based cuprate superconductors for visible and near-infrared wavelengths

Abstract

Keywords

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