Abstract
The optical properties of the BLT films on Si(100) substrates in the wide energy range of 0.73 to 6 eV were investigated using spectroscopic ellipsometry. Crystalline quality affected the dielectric functions of the BLT films beyond the fundamental band gap. The direct fundamental optical band gaps of the BLT films annealed at 590 and 700°C are 4.60 and 4.64 eV, respectively.
| Original language | English |
|---|---|
| Pages (from-to) | 3686-3688 |
| Number of pages | 3 |
| Journal | Applied Physics Letters |
| Volume | 83 |
| Issue number | 18 |
| DOIs | |
| State | Published - 3 Nov 2003 |
| Externally published | Yes |