Dielectric characteristic of fatigued Bi4-xLaxTi 3O12 ferroelectric films

Ni Zhong; Tadashi Shoisaki

doi:10.1109/ISAF.2007.4393192

Dielectric characteristic of fatigued Bi_4-xLa_xTi ₃O₁₂ ferroelectric films

Ni Zhong, Tadashi Shoisaki

Nara Institute of Science and Technology

Research output: Chapter in Book/Report/Conference proceeding › Conference contribution › peer-review

Abstract

Dielectric measurement was carried out on fatigued Bi_4-xLa _xTi₃O₁₂ ferroelectric films. It is found that the dielectric permittivity varies with switching cycles. With the increase of the switching cycles, the dielectric permittivity exhibits a continuous decrease. This decrease is pronounced for BiT films with low concentration of La, while it is slight for Bi_4-xLa_xT₃O ₁₂ films with high concentration of La. Dielectric permittivity was also measured on Bi_3.2La_0.8Ti₃O₁₂ ferroelectric films fatigue at different frequencies 50 kHz and 20 kHz. It exhibits that the decrease of dielectric permittivity is pronounced if the films were fatigued at low frequency, while this decrease is slight if the films were fatigue at high frequency. It is proposed that a growing of an interface layer appears during the fatigue process.

Original language	English
Title of host publication	2007 16th IEEE International Symposium on the Applications of Ferroelectrics, ISAF
Pages	134-135
Number of pages	2
DOIs	https://doi.org/10.1109/ISAF.2007.4393192
State	Published - 2007
Externally published	Yes
Event	2007 16th IEEE International Symposium on the Applications of Ferroelectrics, ISAF - Nara-city, Japan Duration: 27 May 2007 → 31 May 2007

Publication series

Name	IEEE International Symposium on Applications of Ferroelectrics

Conference

Conference	2007 16th IEEE International Symposium on the Applications of Ferroelectrics, ISAF
Country/Territory	Japan
City	Nara-city
Period	27/05/07 → 31/05/07

Access to Document

10.1109/ISAF.2007.4393192

Cite this

@inproceedings{1d4a94817b5c47368cb391197cd3b31f,

title = "Dielectric characteristic of fatigued Bi4-xLaxTi 3O12 ferroelectric films",

abstract = "Dielectric measurement was carried out on fatigued Bi4-xLa xTi3O12 ferroelectric films. It is found that the dielectric permittivity varies with switching cycles. With the increase of the switching cycles, the dielectric permittivity exhibits a continuous decrease. This decrease is pronounced for BiT films with low concentration of La, while it is slight for Bi4-xLaxT3O 12 films with high concentration of La. Dielectric permittivity was also measured on Bi3.2La0.8Ti3O12 ferroelectric films fatigue at different frequencies 50 kHz and 20 kHz. It exhibits that the decrease of dielectric permittivity is pronounced if the films were fatigued at low frequency, while this decrease is slight if the films were fatigue at high frequency. It is proposed that a growing of an interface layer appears during the fatigue process.",

author = "Ni Zhong and Tadashi Shoisaki",

year = "2007",

doi = "10.1109/ISAF.2007.4393192",

language = "英语",

isbn = "1424413338",

series = "IEEE International Symposium on Applications of Ferroelectrics",

pages = "134--135",

booktitle = "2007 16th IEEE International Symposium on the Applications of Ferroelectrics, ISAF",

note = "2007 16th IEEE International Symposium on the Applications of Ferroelectrics, ISAF ; Conference date: 27-05-2007 Through 31-05-2007",

}

Zhong, N & Shoisaki, T 2007, Dielectric characteristic of fatigued Bi_4-xLa_xTi ₃O₁₂ ferroelectric films. in 2007 16th IEEE International Symposium on the Applications of Ferroelectrics, ISAF., 4393192, IEEE International Symposium on Applications of Ferroelectrics, pp. 134-135, 2007 16th IEEE International Symposium on the Applications of Ferroelectrics, ISAF, Nara-city, Japan, 27/05/07. https://doi.org/10.1109/ISAF.2007.4393192

Dielectric characteristic of fatigued Bi_4-xLa_xTi ₃O₁₂ ferroelectric films. / Zhong, Ni; Shoisaki, Tadashi.
2007 16th IEEE International Symposium on the Applications of Ferroelectrics, ISAF. 2007. p. 134-135 4393192 (IEEE International Symposium on Applications of Ferroelectrics).

Research output: Chapter in Book/Report/Conference proceeding › Conference contribution › peer-review

TY - GEN

T1 - Dielectric characteristic of fatigued Bi4-xLaxTi 3O12 ferroelectric films

AU - Zhong, Ni

AU - Shoisaki, Tadashi

PY - 2007

Y1 - 2007

N2 - Dielectric measurement was carried out on fatigued Bi4-xLa xTi3O12 ferroelectric films. It is found that the dielectric permittivity varies with switching cycles. With the increase of the switching cycles, the dielectric permittivity exhibits a continuous decrease. This decrease is pronounced for BiT films with low concentration of La, while it is slight for Bi4-xLaxT3O 12 films with high concentration of La. Dielectric permittivity was also measured on Bi3.2La0.8Ti3O12 ferroelectric films fatigue at different frequencies 50 kHz and 20 kHz. It exhibits that the decrease of dielectric permittivity is pronounced if the films were fatigued at low frequency, while this decrease is slight if the films were fatigue at high frequency. It is proposed that a growing of an interface layer appears during the fatigue process.

AB - Dielectric measurement was carried out on fatigued Bi4-xLa xTi3O12 ferroelectric films. It is found that the dielectric permittivity varies with switching cycles. With the increase of the switching cycles, the dielectric permittivity exhibits a continuous decrease. This decrease is pronounced for BiT films with low concentration of La, while it is slight for Bi4-xLaxT3O 12 films with high concentration of La. Dielectric permittivity was also measured on Bi3.2La0.8Ti3O12 ferroelectric films fatigue at different frequencies 50 kHz and 20 kHz. It exhibits that the decrease of dielectric permittivity is pronounced if the films were fatigued at low frequency, while this decrease is slight if the films were fatigue at high frequency. It is proposed that a growing of an interface layer appears during the fatigue process.

UR - https://www.scopus.com/pages/publications/51349165907

U2 - 10.1109/ISAF.2007.4393192

DO - 10.1109/ISAF.2007.4393192

M3 - 会议稿件

AN - SCOPUS:51349165907

SN - 1424413338

SN - 9781424413331

T3 - IEEE International Symposium on Applications of Ferroelectrics

SP - 134

EP - 135

BT - 2007 16th IEEE International Symposium on the Applications of Ferroelectrics, ISAF

T2 - 2007 16th IEEE International Symposium on the Applications of Ferroelectrics, ISAF

Y2 - 27 May 2007 through 31 May 2007

ER -