Abstract
The series Nb-doped zirconate-rich lead zirconate titanate (PZT) ceramics with high densities up to 97% were fabricated using the traditional solid reaction method. We investigated the dielectric breakdown strength of the series PZT ceramics and detected first that the dielectric breakdown strength increased with an increase in Zr/Ti at the boundary of the antiferroelectric and ferroelectric phases. A qualitative analysis was carried out to discuss the observed phenomena. The relationship between dielectric breakdown and microstructure was also discussed.
| Original language | English |
|---|---|
| Pages (from-to) | 7579-7582 |
| Number of pages | 4 |
| Journal | Japanese Journal of Applied Physics, Part 1: Regular Papers and Short Notes and Review Papers |
| Volume | 43 |
| Issue number | 11 A |
| DOIs | |
| State | Published - Nov 2004 |
| Externally published | Yes |
Keywords
- AF-F phase transition
- Dielectric breakdown strength
- Microstructure
- Nb-doped Zr-rich PZT
- Zr/Ti