Dielectric breakdown properties of Zr-rich lead zirconate titanate ceramics

  • Hong Yang*
  • , Xian Lin Dong
  • , Ni Zhong
  • , Yong Ling Wang
  • *Corresponding author for this work

Research output: Contribution to journalArticlepeer-review

8 Scopus citations

Abstract

The series Nb-doped zirconate-rich lead zirconate titanate (PZT) ceramics with high densities up to 97% were fabricated using the traditional solid reaction method. We investigated the dielectric breakdown strength of the series PZT ceramics and detected first that the dielectric breakdown strength increased with an increase in Zr/Ti at the boundary of the antiferroelectric and ferroelectric phases. A qualitative analysis was carried out to discuss the observed phenomena. The relationship between dielectric breakdown and microstructure was also discussed.

Original languageEnglish
Pages (from-to)7579-7582
Number of pages4
JournalJapanese Journal of Applied Physics, Part 1: Regular Papers and Short Notes and Review Papers
Volume43
Issue number11 A
DOIs
StatePublished - Nov 2004
Externally publishedYes

Keywords

  • AF-F phase transition
  • Dielectric breakdown strength
  • Microstructure
  • Nb-doped Zr-rich PZT
  • Zr/Ti

Fingerprint

Dive into the research topics of 'Dielectric breakdown properties of Zr-rich lead zirconate titanate ceramics'. Together they form a unique fingerprint.

Cite this