Dielectric and piezoelectric properties of SrBi2-xSm xNb2O9 (x=0, 0.05, 0.1, 0.2, 0.3, and 0.4) ceramics

  • Lin Sun
  • , Chude Feng*
  • , Lidong Chen
  • , Shiming Huang
  • *Corresponding author for this work

Research output: Contribution to journalArticlepeer-review

32 Scopus citations

Abstract

The dielectric and piezoelectric properties of SrBi2-xSm xNb2O9 (x=0, 0.05, 0.1, 0.2, 0.3, and 0.4) ceramics were investigated. SrBi2-xSmxNb2O 9 ceramics were synthesized by the conventional solid-state reaction sintering method. An X-ray diffraction measurement indicated that a single-phase-layered perovskite was obtained for all compositions. The substitution of Sm3+ for Bi3+ in the Bi2O 2 layers induced a relaxor behavior of frequency dispersion for SrBi2-xSmxNb2O9. The Raman spectra of SrBi2-xSmxNb2O9 revealed that the decrease in Tm could be attributed to smaller structural distortion of NbO6 octahedra that is induced by the substitution of Sm 3+ for Bi3+. SrBi2-xSmxNb 2O9 (x≤0.2) ceramics are suitable for fine tolerance resonator applications because the Sm3+ doping in Bi 2O2 layers can improve the temperature coefficient of resonance frequency.

Original languageEnglish
Pages (from-to)3875-3881
Number of pages7
JournalJournal of the American Ceramic Society
Volume90
Issue number12
DOIs
StatePublished - Dec 2007
Externally publishedYes

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