Determination of cut-off wavelength and composition distribution in Hg1-xCdxTe

Junhao Chu; Yongsheng Gui; Biao Li; Dingyuan Tang

doi:10.1007/s11664-998-0042-2

Determination of cut-off wavelength and composition distribution in Hg_1-xCd_xTe

Junhao Chu^*, Yongsheng Gui, Biao Li, Dingyuan Tang

^*Corresponding author for this work

CAS - Shanghai Institute of Technical Physics

Research output: Contribution to journal › Article › peer-review

5 Scopus citations

Abstract

The determination of cut-off wavelength, λ_co, and composition distribution for Hg_1-xCd_xTe has been discussed in this paper. A shift of the cut-off wavelength was found from the photo-response calculation for the HgCdTe devices with the same energy gap E_g but different thickness d. An expression of λ_co(x,T,d) has been derived from the half-maximum photo-response curve calculation. The composition uniformity has been determined from the room-temperature transmission fitting procedure. The composition real space distribution is suggested to be determined by the combination of absorption edge phenomenon and thermal imaging technique.

Original language	English
Pages (from-to)	718-721
Number of pages	4
Journal	Journal of Electronic Materials
Volume	27
Issue number	6
DOIs	https://doi.org/10.1007/s11664-998-0042-2
State	Published - Jun 1998
Externally published	Yes

Keywords

Composition uniformity
Cut-off wavelength
HgCdTe

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10.1007/s11664-998-0042-2

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title = "Determination of cut-off wavelength and composition distribution in Hg1-xCdxTe",

abstract = "The determination of cut-off wavelength, λco, and composition distribution for Hg1-xCdxTe has been discussed in this paper. A shift of the cut-off wavelength was found from the photo-response calculation for the HgCdTe devices with the same energy gap Eg but different thickness d. An expression of λco(x,T,d) has been derived from the half-maximum photo-response curve calculation. The composition uniformity has been determined from the room-temperature transmission fitting procedure. The composition real space distribution is suggested to be determined by the combination of absorption edge phenomenon and thermal imaging technique.",

keywords = "Composition uniformity, Cut-off wavelength, HgCdTe",

author = "Junhao Chu and Yongsheng Gui and Biao Li and Dingyuan Tang",

year = "1998",

month = jun,

doi = "10.1007/s11664-998-0042-2",

language = "英语",

volume = "27",

pages = "718--721",

journal = "Journal of Electronic Materials",

issn = "0361-5235",

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TY - JOUR

T1 - Determination of cut-off wavelength and composition distribution in Hg1-xCdxTe

AU - Chu, Junhao

AU - Gui, Yongsheng

AU - Li, Biao

AU - Tang, Dingyuan

PY - 1998/6

Y1 - 1998/6

N2 - The determination of cut-off wavelength, λco, and composition distribution for Hg1-xCdxTe has been discussed in this paper. A shift of the cut-off wavelength was found from the photo-response calculation for the HgCdTe devices with the same energy gap Eg but different thickness d. An expression of λco(x,T,d) has been derived from the half-maximum photo-response curve calculation. The composition uniformity has been determined from the room-temperature transmission fitting procedure. The composition real space distribution is suggested to be determined by the combination of absorption edge phenomenon and thermal imaging technique.

AB - The determination of cut-off wavelength, λco, and composition distribution for Hg1-xCdxTe has been discussed in this paper. A shift of the cut-off wavelength was found from the photo-response calculation for the HgCdTe devices with the same energy gap Eg but different thickness d. An expression of λco(x,T,d) has been derived from the half-maximum photo-response curve calculation. The composition uniformity has been determined from the room-temperature transmission fitting procedure. The composition real space distribution is suggested to be determined by the combination of absorption edge phenomenon and thermal imaging technique.

KW - Composition uniformity

KW - Cut-off wavelength

KW - HgCdTe

UR - https://www.scopus.com/pages/publications/0001757739

U2 - 10.1007/s11664-998-0042-2

DO - 10.1007/s11664-998-0042-2

M3 - 文章

AN - SCOPUS:0001757739

SN - 0361-5235

VL - 27

SP - 718

EP - 721

JO - Journal of Electronic Materials

JF - Journal of Electronic Materials

IS - 6

ER -

Determination of cut-off wavelength and composition distribution in Hg_1-xCd_xTe

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Keywords

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