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Detection of resistive switching behavior based on the Al2O3/ZnO/Al2O3 structure with alumina buffers

  • East China Normal University
  • CAS - Shanghai Institute of Technical Physics

Research output: Contribution to journalArticlepeer-review

Abstract

The single ZnO layer and a sandwich Al2O3/ZnO/Al2O3 structure were prepared via atomic layer deposition, and the single ZnO layer showed a feature of ohmic conduction only. When we added that together with top and bottom alumina buffers, a non-polar resistive switching (RS) behavior was accomplished, allowing investigation of its electric endurance and retention characteristics. Analysis of the conduction mechanism at both high and low resistance states using auxiliary mathematic tools resulted in the proposed model of conducting filaments formed in the insulating Al2O3 buffers. The effect of stopping voltage Vend on the resistance window at high resistance state is studied and discussed.

Original languageEnglish
Pages (from-to)8-13
Number of pages6
JournalThin Solid Films
Volume623
DOIs
StatePublished - 1 Feb 2017

Keywords

  • Buffer layer
  • Non-polar resistive switching
  • Sandwich structure
  • Transition metal oxide

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