Abstract
A hyperspectral imaging system is developed and is used to identify cracks and fracture defects in solar cells. The basic principles and key technologies of this system are presented, along with a characterization of its performance. The system can provided both single-band images and spectrums of solar cells by laser scanning and hyperspectral imaging. The spectral angle mapper algorithm is used to identify cracks on the surface of solar cells. Experiment results show that this is a non-contact, no-destructive method for detecting cracks in solar cells. Crown
| Original language | English |
|---|---|
| Pages (from-to) | 1010-1013 |
| Number of pages | 4 |
| Journal | Optics and Laser Technology |
| Volume | 42 |
| Issue number | 6 |
| DOIs | |
| State | Published - Sep 2010 |
Keywords
- Hyperspectral imaging
- Material defect detection
- Solar cell