Detection of physical defects in solar cells by hyperspectral imaging technology

  • Qingli Li*
  • , Weisheng Wang
  • , Chao Ma
  • , Ziqiang Zhu
  • *Corresponding author for this work

Research output: Contribution to journalArticlepeer-review

41 Scopus citations

Abstract

A hyperspectral imaging system is developed and is used to identify cracks and fracture defects in solar cells. The basic principles and key technologies of this system are presented, along with a characterization of its performance. The system can provided both single-band images and spectrums of solar cells by laser scanning and hyperspectral imaging. The spectral angle mapper algorithm is used to identify cracks on the surface of solar cells. Experiment results show that this is a non-contact, no-destructive method for detecting cracks in solar cells. Crown

Original languageEnglish
Pages (from-to)1010-1013
Number of pages4
JournalOptics and Laser Technology
Volume42
Issue number6
DOIs
StatePublished - Sep 2010

Keywords

  • Hyperspectral imaging
  • Material defect detection
  • Solar cell

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