Design for easily applying test vectors to improve delay fault coverage

Edwin Hsing Mean Sha; Liang Fang Chao

Design for easily applying test vectors to improve delay fault coverage

Edwin Hsing Mean Sha^*
, Liang Fang Chao

^*Corresponding author for this work

Unknown

Research output: Chapter in Book/Report/Conference proceeding › Conference contribution › peer-review

Abstract

It has been noted that arbitrary test pairs (v₁, v₂) cannot be applied to a combinational pair of a finite state machine using standard scan path design. The scan path design is a special case of test machines which are designed to control and observe the object machine for detecting faults. By studying state transition graphs, the authors propose a general framework, which is composed of two stages, to solve this problem. Given a set of test pairs and a set of test machines, the first stage is to select a test machine which has the maximum delay fault coverage. If the fault coverage is not satisfactory, two approaches are proposed at the second stage. It is shown that these two optimization problems in the second stage are both NP-hard. Three algorithms are designed to solve these problems.

Original language	English
Title of host publication	1991 IEEE International Conference on Computer-Aided Design Digest of Technical Papers
Publisher	Publ by IEEE
Pages	500-503
Number of pages	4
ISBN (Print)	0818621575
State	Published - 1992
Externally published	Yes
Event	1991 IEEE International Conference on Computer-Aided Design - ICCAD-91 - Santa Clara, CA, USA Duration: 11 Nov 1991 → 14 Nov 1991

Publication series

Name	1991 IEEE International Conference on Computer-Aided Design Digest of Technical Papers

Conference

Conference	1991 IEEE International Conference on Computer-Aided Design - ICCAD-91
City	Santa Clara, CA, USA
Period	11/11/91 → 14/11/91

Cite this

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title = "Design for easily applying test vectors to improve delay fault coverage",

abstract = "It has been noted that arbitrary test pairs (v1, v2) cannot be applied to a combinational pair of a finite state machine using standard scan path design. The scan path design is a special case of test machines which are designed to control and observe the object machine for detecting faults. By studying state transition graphs, the authors propose a general framework, which is composed of two stages, to solve this problem. Given a set of test pairs and a set of test machines, the first stage is to select a test machine which has the maximum delay fault coverage. If the fault coverage is not satisfactory, two approaches are proposed at the second stage. It is shown that these two optimization problems in the second stage are both NP-hard. Three algorithms are designed to solve these problems.",

author = "Sha, \{Edwin Hsing Mean\} and Chao, \{Liang Fang\}",

year = "1992",

language = "英语",

isbn = "0818621575",

series = "1991 IEEE International Conference on Computer-Aided Design Digest of Technical Papers",

publisher = "Publ by IEEE",

pages = "500--503",

booktitle = "1991 IEEE International Conference on Computer-Aided Design Digest of Technical Papers",

note = "1991 IEEE International Conference on Computer-Aided Design - ICCAD-91 ; Conference date: 11-11-1991 Through 14-11-1991",

}

Sha, EHM & Chao, LF 1992, Design for easily applying test vectors to improve delay fault coverage. in 1991 IEEE International Conference on Computer-Aided Design Digest of Technical Papers. 1991 IEEE International Conference on Computer-Aided Design Digest of Technical Papers, Publ by IEEE, pp. 500-503, 1991 IEEE International Conference on Computer-Aided Design - ICCAD-91, Santa Clara, CA, USA, 11/11/91.

Design for easily applying test vectors to improve delay fault coverage. / Sha, Edwin Hsing Mean; Chao, Liang Fang.
1991 IEEE International Conference on Computer-Aided Design Digest of Technical Papers. Publ by IEEE, 1992. p. 500-503 (1991 IEEE International Conference on Computer-Aided Design Digest of Technical Papers).

Research output: Chapter in Book/Report/Conference proceeding › Conference contribution › peer-review

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AU - Sha, Edwin Hsing Mean

AU - Chao, Liang Fang

PY - 1992

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N2 - It has been noted that arbitrary test pairs (v1, v2) cannot be applied to a combinational pair of a finite state machine using standard scan path design. The scan path design is a special case of test machines which are designed to control and observe the object machine for detecting faults. By studying state transition graphs, the authors propose a general framework, which is composed of two stages, to solve this problem. Given a set of test pairs and a set of test machines, the first stage is to select a test machine which has the maximum delay fault coverage. If the fault coverage is not satisfactory, two approaches are proposed at the second stage. It is shown that these two optimization problems in the second stage are both NP-hard. Three algorithms are designed to solve these problems.

AB - It has been noted that arbitrary test pairs (v1, v2) cannot be applied to a combinational pair of a finite state machine using standard scan path design. The scan path design is a special case of test machines which are designed to control and observe the object machine for detecting faults. By studying state transition graphs, the authors propose a general framework, which is composed of two stages, to solve this problem. Given a set of test pairs and a set of test machines, the first stage is to select a test machine which has the maximum delay fault coverage. If the fault coverage is not satisfactory, two approaches are proposed at the second stage. It is shown that these two optimization problems in the second stage are both NP-hard. Three algorithms are designed to solve these problems.

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M3 - 会议稿件

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T3 - 1991 IEEE International Conference on Computer-Aided Design Digest of Technical Papers

SP - 500

EP - 503

BT - 1991 IEEE International Conference on Computer-Aided Design Digest of Technical Papers

PB - Publ by IEEE

T2 - 1991 IEEE International Conference on Computer-Aided Design - ICCAD-91

Y2 - 11 November 1991 through 14 November 1991

ER -

Design for easily applying test vectors to improve delay fault coverage

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Conference

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