Deep wavelet network with domain adaptation for single image demoireing

  • Xiaotong Luo
  • , Jiangtao Zhang
  • , Ming Hong
  • , Yanyun Qu
  • , Yuan Xie*
  • , Cuihua Li
  • *Corresponding author for this work

Research output: Chapter in Book/Report/Conference proceedingConference contributionpeer-review

23 Scopus citations

Abstract

Convolutional neural networks have made a prominent progress in low-level image restoration tasks. Moire is a kind of high-frequency and irregular interference stripe that appears on the photosensitive element of digital cameras or scanners. It can bring in unpleasant colorful artifacts on images. In this paper, we propose a deep wavelet network with domain adaptation mechanism for single image demoireing, dubbed AWUDN. The feature mapping is mainly performed in the wavelet domain, which can not only cut down computation complexity, but also reduce information loss. Moreover, considering that the images provided by the challenge organizers have strong self-similarity, the global context block is adopted for the learning of feature dependency in different positions. Finally, we introduce the domain adaptation mechanism to fine-tune the pretrained model for reducing the domain gap between training moire dataset and testing moire dataset. Benefiting from these improvements, the proposed method can achieve superior accuracy on the public testing dataset in the NTIRE 2020 Single Image Demoireing Challenge.

Original languageEnglish
Title of host publicationProceedings - 2020 IEEE/CVF Conference on Computer Vision and Pattern Recognition Workshops, CVPRW 2020
PublisherIEEE Computer Society
Pages1687-1694
Number of pages8
ISBN (Electronic)9781728193601
DOIs
StatePublished - Jun 2020
Event2020 IEEE/CVF Conference on Computer Vision and Pattern Recognition Workshops, CVPRW 2020 - Virtual, Online, United States
Duration: 14 Jun 202019 Jun 2020

Publication series

NameIEEE Computer Society Conference on Computer Vision and Pattern Recognition Workshops
Volume2020-June
ISSN (Print)2160-7508
ISSN (Electronic)2160-7516

Conference

Conference2020 IEEE/CVF Conference on Computer Vision and Pattern Recognition Workshops, CVPRW 2020
Country/TerritoryUnited States
CityVirtual, Online
Period14/06/2019/06/20

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