Deep Knowledge Tracing with Learning Curves

  • Shanghui Yang
  • , Xin Liu
  • , Hang Su
  • , Mengxia Zhu
  • , Xuesong Lu*
  • *Corresponding author for this work

Research output: Chapter in Book/Report/Conference proceedingConference contributionpeer-review

8 Scopus citations

Abstract

Knowledge tracing (KT) models students' mastery level of knowledge concepts based on their responses to the questions in the past and predicts the probability that they correctly answer subsequent questions in the future. Recent KT models are mostly developed with deep neural networks and have demonstrated superior performance over traditional approaches. However, they ignore the explicit modeling of the learning curve theory, which generally says that more practices on the same knowledge concept enhance one's mastery level of the concept. Based on this theory, we propose a Convolution-Augmented Knowledge Tracing (CAKT) model to enable learning curve modeling. In particular, when predicting a student's response to the next question associated with a specific knowledge concept, CAKT uses a module built with three-dimensional convolutional neural networks to learn the student's recent experience on that concept. Moreover, CAKT employs LSTM networks to learn the overall knowledge state, which is fused with the feature learned by the convolutional module. As such, CAKT can learn the student's overall knowledge state as well as the knowledge state of the concept in the next question. Experimental results on four real-life datasets show that CAKT achieves better performance compared to existing deep KT models.

Original languageEnglish
Title of host publicationProceedings - 22nd IEEE International Conference on Data Mining Workshops, ICDMW 2022
EditorsK. Selcuk Candan, Thang N. Dinh, My T. Thai, Takashi Washio
PublisherIEEE Computer Society
Pages282-291
Number of pages10
ISBN (Electronic)9798350346091
DOIs
StatePublished - 2022
Event22nd IEEE International Conference on Data Mining Workshops, ICDMW 2022 - Orlando, United States
Duration: 28 Nov 20221 Dec 2022

Publication series

NameIEEE International Conference on Data Mining Workshops, ICDMW
Volume2022-November
ISSN (Print)2375-9232
ISSN (Electronic)2375-9259

Conference

Conference22nd IEEE International Conference on Data Mining Workshops, ICDMW 2022
Country/TerritoryUnited States
CityOrlando
Period28/11/221/12/22

Keywords

  • knowledge tracing
  • learning curve theory
  • three-dimensional convolutional neural networks

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