Decision ordering based property decomposition for functional test generation

  • Mingsong Chen*
  • , Prabhat Mishra
  • *Corresponding author for this work

Research output: Chapter in Book/Report/Conference proceedingConference contributionpeer-review

12 Scopus citations

Abstract

SAT-based BMC is promising for directed test generation since it can locate the reason of an error within a small bound. However, due to the state space explosion problem, BMC cannot handle complex designs and properties. Although various optimization methods are proposed to address a single complex property, the test generation process cannot be fully automated. This paper presents an efficient automated approach that can scale down the falsification complexity using property decomposition and learning techniques. Our experimental results using both software and hardware benchmarks demonstrate that our approach can drastically reduce the overall test generation effort.

Original languageEnglish
Title of host publicationProceedings - Design, Automation and Test in Europe Conference and Exhibition, DATE 2011
Pages167-172
Number of pages6
StatePublished - 2011
Event14th Design, Automation and Test in Europe Conference and Exhibition, DATE 2011 - Grenoble, France
Duration: 14 Mar 201118 Mar 2011

Publication series

NameProceedings -Design, Automation and Test in Europe, DATE
ISSN (Print)1530-1591

Conference

Conference14th Design, Automation and Test in Europe Conference and Exhibition, DATE 2011
Country/TerritoryFrance
CityGrenoble
Period14/03/1118/03/11

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