Cutoff wavelength of Hg1-x Cdx Te epilayers by infrared photoreflectance spectroscopy

Jun Shao; Xiang Lü; Wei Lu; Fangyu Yue; Wei Huang; Ning Li; Jun Wu; Li He; Junhao Chu

doi:10.1063/1.2731705

Cutoff wavelength of Hg_1-x Cd_x Te epilayers by infrared photoreflectance spectroscopy

Jun Shao^*
, Xiang Lü
, Wei Lu
, Fangyu Yue
, Wei Huang
, Ning Li
, Jun Wu
, Li He
, Junhao Chu

^*Corresponding author for this work

School of Physics and Electronic Science

CAS - Shanghai Institute of Technical Physics

Research output: Contribution to journal › Article › peer-review

23 Scopus citations

Abstract

A comparative study of cutoff wavelength is performed by photocurrent (PC), transmission, and infrared photoreflectance (PR) spectroscopies on arsenic-doped Hg1-x Cdx Te molecular beam epitaxial layers in the midinfrared spectral region. It is illustrated that (i) a shorter cutoff wavelength of PC response may be predicted by either the band gap or the energy of the half-maximum transmission and (ii) the main PR peak is coincident energetically to that of the third-derivative maximum of the PC spectrum. The mechanism behind is discussed with the aid of photoluminescence measurements. The results indicate that the infrared PR spectroscopy may serve as a contactless alternative to the PC spectroscopy for predicting the cutoff wavelength of narrow-gap HgCdTe epilayers reliably.

Original language	English
Article number	171101
Journal	Applied Physics Letters
Volume	90
Issue number	17
DOIs	https://doi.org/10.1063/1.2731705
State	Published - 2007

Access to Document

10.1063/1.2731705

Cite this

@article{cb1a7f7135ed469ab9c105d12916feb1,

title = "Cutoff wavelength of Hg1-x Cdx Te epilayers by infrared photoreflectance spectroscopy",

abstract = "A comparative study of cutoff wavelength is performed by photocurrent (PC), transmission, and infrared photoreflectance (PR) spectroscopies on arsenic-doped Hg1-x Cdx Te molecular beam epitaxial layers in the midinfrared spectral region. It is illustrated that (i) a shorter cutoff wavelength of PC response may be predicted by either the band gap or the energy of the half-maximum transmission and (ii) the main PR peak is coincident energetically to that of the third-derivative maximum of the PC spectrum. The mechanism behind is discussed with the aid of photoluminescence measurements. The results indicate that the infrared PR spectroscopy may serve as a contactless alternative to the PC spectroscopy for predicting the cutoff wavelength of narrow-gap HgCdTe epilayers reliably.",

author = "Jun Shao and Xiang L{\"u} and Wei Lu and Fangyu Yue and Wei Huang and Ning Li and Jun Wu and Li He and Junhao Chu",

year = "2007",

doi = "10.1063/1.2731705",

language = "英语",

volume = "90",

journal = "Applied Physics Letters",

issn = "0003-6951",

publisher = "American Institute of Physics",

number = "17",

}

TY - JOUR

T1 - Cutoff wavelength of Hg1-x Cdx Te epilayers by infrared photoreflectance spectroscopy

AU - Shao, Jun

AU - Lü, Xiang

AU - Lu, Wei

AU - Yue, Fangyu

AU - Huang, Wei

AU - Li, Ning

AU - Wu, Jun

AU - He, Li

AU - Chu, Junhao

PY - 2007

Y1 - 2007

N2 - A comparative study of cutoff wavelength is performed by photocurrent (PC), transmission, and infrared photoreflectance (PR) spectroscopies on arsenic-doped Hg1-x Cdx Te molecular beam epitaxial layers in the midinfrared spectral region. It is illustrated that (i) a shorter cutoff wavelength of PC response may be predicted by either the band gap or the energy of the half-maximum transmission and (ii) the main PR peak is coincident energetically to that of the third-derivative maximum of the PC spectrum. The mechanism behind is discussed with the aid of photoluminescence measurements. The results indicate that the infrared PR spectroscopy may serve as a contactless alternative to the PC spectroscopy for predicting the cutoff wavelength of narrow-gap HgCdTe epilayers reliably.

AB - A comparative study of cutoff wavelength is performed by photocurrent (PC), transmission, and infrared photoreflectance (PR) spectroscopies on arsenic-doped Hg1-x Cdx Te molecular beam epitaxial layers in the midinfrared spectral region. It is illustrated that (i) a shorter cutoff wavelength of PC response may be predicted by either the band gap or the energy of the half-maximum transmission and (ii) the main PR peak is coincident energetically to that of the third-derivative maximum of the PC spectrum. The mechanism behind is discussed with the aid of photoluminescence measurements. The results indicate that the infrared PR spectroscopy may serve as a contactless alternative to the PC spectroscopy for predicting the cutoff wavelength of narrow-gap HgCdTe epilayers reliably.

UR - https://www.scopus.com/pages/publications/34248583086

U2 - 10.1063/1.2731705

DO - 10.1063/1.2731705

M3 - 文章

AN - SCOPUS:34248583086

SN - 0003-6951

VL - 90

JO - Applied Physics Letters

JF - Applied Physics Letters

IS - 17

M1 - 171101

ER -

Cutoff wavelength of Hg_1-x Cd_x Te epilayers by infrared photoreflectance spectroscopy

Abstract

Access to Document

Other files and links

Fingerprint

Cite this