Cu2ZnSnS4 films fabricated by a simple sol-gel process without sulfurization

Ke Zhi Zhang; Jun He; Wei Jun Wang; Lin Sun; Ping Xiong Yang; Jun Hao Chu

doi:10.11972/j.issn.1001-9014.2015.02.001

Cu₂ZnSnS₄ films fabricated by a simple sol-gel process without sulfurization

Ke Zhi Zhang, Jun He, Wei Jun Wang, Lin Sun, Ping Xiong Yang, Jun Hao Chu

School of Physics and Electronic Science

East China Normal University

Research output: Contribution to journal › Article › peer-review

1 Scopus citations

Abstract

Cu₂ZnSnS₄ (CZTS) films with a smooth and compact morphology were obtained via a sol-gel process. Raman spectra and X-ray diffraction (XRD) results indicate that all the films have the kesterite structure. Energy dispersive X-ray spectroscopy (EDS) suggests that all of CZTS films are of S-deficient, Cu-poor and Zn-rich states. The thickness of all the films is around 0.7 μm measured by a field emission scanning electron microscope (FE-SEM). Transmission spectra reveal that the optical band gap (E_g) of samples reduces from 2.13 to 1.52eV as post-annealing temperature goes up.

Original language	English
Pages (from-to)	129-133
Number of pages	5
Journal	Hongwai Yu Haomibo Xuebao/Journal of Infrared and Millimeter Waves
Volume	34
Issue number	2
DOIs	https://doi.org/10.11972/j.issn.1001-9014.2015.02.001
State	Published - 1 Apr 2015

Keywords

Composition
CuZnSnS(CZTS)
Film
Post-anneal
Pre-anneal
Precursor
Sol-gel

Access to Document

10.11972/j.issn.1001-9014.2015.02.001

Cite this

@article{48b89878013247e8bae2eb3cc96bfca2,

title = "Cu2ZnSnS4 films fabricated by a simple sol-gel process without sulfurization",

abstract = "Cu2ZnSnS4 (CZTS) films with a smooth and compact morphology were obtained via a sol-gel process. Raman spectra and X-ray diffraction (XRD) results indicate that all the films have the kesterite structure. Energy dispersive X-ray spectroscopy (EDS) suggests that all of CZTS films are of S-deficient, Cu-poor and Zn-rich states. The thickness of all the films is around 0.7 μm measured by a field emission scanning electron microscope (FE-SEM). Transmission spectra reveal that the optical band gap (Eg) of samples reduces from 2.13 to 1.52eV as post-annealing temperature goes up.",

keywords = "Composition, CuZnSnS(CZTS), Film, Post-anneal, Pre-anneal, Precursor, Sol-gel",

author = "Zhang, \{Ke Zhi\} and Jun He and Wang, \{Wei Jun\} and Lin Sun and Yang, \{Ping Xiong\} and Chu, \{Jun Hao\}",

year = "2015",

month = apr,

day = "1",

doi = "10.11972/j.issn.1001-9014.2015.02.001",

language = "英语",

volume = "34",

pages = "129--133",

journal = "Hongwai Yu Haomibo Xuebao/Journal of Infrared and Millimeter Waves",

issn = "1001-9014",

publisher = "Chinese Optical Society",

number = "2",

}

TY - JOUR

T1 - Cu2ZnSnS4 films fabricated by a simple sol-gel process without sulfurization

AU - Zhang, Ke Zhi

AU - He, Jun

AU - Wang, Wei Jun

AU - Sun, Lin

AU - Yang, Ping Xiong

AU - Chu, Jun Hao

PY - 2015/4/1

Y1 - 2015/4/1

N2 - Cu2ZnSnS4 (CZTS) films with a smooth and compact morphology were obtained via a sol-gel process. Raman spectra and X-ray diffraction (XRD) results indicate that all the films have the kesterite structure. Energy dispersive X-ray spectroscopy (EDS) suggests that all of CZTS films are of S-deficient, Cu-poor and Zn-rich states. The thickness of all the films is around 0.7 μm measured by a field emission scanning electron microscope (FE-SEM). Transmission spectra reveal that the optical band gap (Eg) of samples reduces from 2.13 to 1.52eV as post-annealing temperature goes up.

AB - Cu2ZnSnS4 (CZTS) films with a smooth and compact morphology were obtained via a sol-gel process. Raman spectra and X-ray diffraction (XRD) results indicate that all the films have the kesterite structure. Energy dispersive X-ray spectroscopy (EDS) suggests that all of CZTS films are of S-deficient, Cu-poor and Zn-rich states. The thickness of all the films is around 0.7 μm measured by a field emission scanning electron microscope (FE-SEM). Transmission spectra reveal that the optical band gap (Eg) of samples reduces from 2.13 to 1.52eV as post-annealing temperature goes up.

KW - Composition

KW - CuZnSnS(CZTS)

KW - Film

KW - Post-anneal

KW - Pre-anneal

KW - Precursor

KW - Sol-gel

UR - https://www.scopus.com/pages/publications/84929458702

U2 - 10.11972/j.issn.1001-9014.2015.02.001

DO - 10.11972/j.issn.1001-9014.2015.02.001

M3 - 文章

AN - SCOPUS:84929458702

SN - 1001-9014

VL - 34

SP - 129

EP - 133

JO - Hongwai Yu Haomibo Xuebao/Journal of Infrared and Millimeter Waves

JF - Hongwai Yu Haomibo Xuebao/Journal of Infrared and Millimeter Waves

IS - 2

ER -

Cu₂ZnSnS₄ films fabricated by a simple sol-gel process without sulfurization

Abstract

Keywords

Access to Document

Other files and links

Fingerprint

Cite this