@inproceedings{4ec89aaf54c24ac2b9b3c347c75b36c6,
title = "Crystallization of manganese cobalt nickelate films prepared by chemical deposition",
abstract = "Manganese cobalt nickelate films (MnxCoyNi 3-x-y)O4 (MCN) are successfully prepared by chemical deposition method at a crystallization temperature of 600°C, which is greatly reduced from the traditional sintered temperature of \textasciitilde{}1050 - 1200°C. From the XRD and AFM, we find the grain size of the MCN films increases from 20 to 60 nm with the annealing temperature increase from 600°C to 900°C.",
keywords = "Atomic force microscopy, Diffraction, Manganese cobalt nickelate film",
author = "Yujian Ge and Zhiming Huang and Yun Hou and Tianxin Li and Junhao Chu",
year = "2008",
doi = "10.1117/12.792120",
language = "英语",
isbn = "9780819471826",
series = "Proceedings of SPIE - The International Society for Optical Engineering",
booktitle = "Sixth International Conference on Thin Film Physics and Applications",
note = "6th International Conference on Thin Film Physics and Applications, TFPA 2007 ; Conference date: 25-09-2007 Through 28-09-2007",
}