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Crystallization behavior of Ge2Te3-TiO2 film for phase-change random access memory application

  • Yegang Lu*
  • , Sannian Song
  • , Zhitang Song
  • , Yan Cheng
  • , Liangcai Wu
  • , Bo Liu
  • *Corresponding author for this work

Research output: Chapter in Book/Report/Conference proceedingConference contributionpeer-review

Abstract

Crystallization behavior of the Ge2Te3-TiO 2 films prepared by the co-sputtering using Ge2Te 3 and TiO2 targets was investigated by in situ resistance-temperature measurement and transmission electron microscopy. The crystallization kinetic parameters including rate factor and kinetics exponent were obtained by the non-isothermal change in resistance using Kissinger's plot and Ozawa's method. The average kinetics exponent was estimated by the nonisothermal change in resistance. Compared with other studied compositions, the composition with TiO2 concentration of 5 at.% exhibited shorter crystallization time which was calculated by the Johnson-Mehl-Avrami equation. The crystallization behavior of Ge2Te3-TiO2 film was verified by the transition electron microscopy at different annealing temperature. With the short crystallization time and high crystallization temperature, the compositions with TiO2 concentration of 5-15 at.% may be one of the competing candidates for phase change memory application.

Original languageEnglish
Title of host publication2012 International Workshop on Information Storage and Ninth International Symposium on Optical Storage
DOIs
StatePublished - 2013
Externally publishedYes
Event2012 International Workshop on Information Storage, IWIS 2012 and 9th International Symposium on Optical Storage, ISOS 2012 - Shanghai, China
Duration: 21 Oct 201224 Oct 2012

Publication series

NameProceedings of SPIE - The International Society for Optical Engineering
Volume8782
ISSN (Print)0277-786X
ISSN (Electronic)1996-756X

Conference

Conference2012 International Workshop on Information Storage, IWIS 2012 and 9th International Symposium on Optical Storage, ISOS 2012
Country/TerritoryChina
CityShanghai
Period21/10/1224/10/12

Keywords

  • Crystallization
  • GeTe
  • Kinetics
  • Nanocomposite
  • Phase change memory

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