Corrigendum to “WDP-BNN: Efficient wafer defect pattern classification via binarized neural network” [Integration 85 (2022) 76–86, (Integration (2022) 85(76-86) (S0167926022000414), (10.1016/j.vlsi.2022.04.003))

The authors regret the incorrect publication of Fig. 5 and an incorrect citation in the original article of the published version. Fig. 3 should have been cited in the first sentence of Section 3.3. Instead, it is cited as Fig. 2 under this section. The correct version of Fig. 5 is presented below.[Formula presented] The authors would like to apologise for any inconvenience caused.