Abstract
Temperature-dependent dielectric spectroscopy was used to observe multiple dielectric responses involving four sets of dielectric relaxations (DRs) in molecular beam epitaxy-deposited ultrathin (001) SrMnO3/Nb:SrTiO3 heterojunctions. Two sets of oxygen-vacancy (OV)-related DRs, which were sensitive to oxygen annealing, were attributed to short-range OV hopping and localized Jahn-Teller (JT)-polaron hopping-induced dipolar-type relaxations.
| Original language | English |
|---|---|
| Article number | 142901 |
| Journal | Applied Physics Letters |
| Volume | 116 |
| Issue number | 14 |
| DOIs | |
| State | Published - 6 Apr 2020 |
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