Contour: A Process Variation Aware Wear-Leveling Mechanism for Inodes of Persistent Memory File Systems

Xianzhang Chen, Edwin H.M. Sha, Xinxin Wang, Chaoshu Yang, Weiwen Jiang, Qingfeng Zhuge

Research output: Contribution to journalArticlepeer-review

5 Scopus citations

Abstract

Existing persistent memory file systems exploit the fast, byte-addressable persistent memory (PM) to boost storage performance but ignore the limited endurance of PM. Particularly, the PM storing the inode section is extremely vulnerable for the inodes are most frequently updated, fixed on a location throughout lifetime, and require immediate persistency. The huge endurance variation of persistent memory domains caused by process variation makes things even worse. In this article, we propose a process variation aware wear leveling mechanism called Contour for the inode section of persistent memory file system. Contour first enables the movement of inodes by virtualizing the inodes with a deflection table. Then, Contour adopts cross-domain migration algorithm and intra-domain migration algorithm to balance the writes across and within the memory domains. We implement the proposed Contour mechanism in Linux kernel 4.4.30 based on a real persistent memory file system, SIMFS. We use standard benchmarks, including Filebench, MySQL, and FIO, to evaluate Contour. Extensive experimental results show Contour can improve the wear ratios of pages 417.8× and 4.5× over the original SIMFS and PCV, the state-of-the-art inode wear-leveling algorithm, respectively. Meanwhile, the average performance overhead and wear overhead of Contour are 0.87 and 0.034 percent in application-level workloads, respectively.

Original languageEnglish
Article number9117177
Pages (from-to)1034-1045
Number of pages12
JournalIEEE Transactions on Computers
Volume70
Issue number7
DOIs
StatePublished - 1 Jul 2021

Keywords

  • Persistent memory file system
  • metadata management
  • persistent memory
  • process variation
  • wear leveling

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