Composition dependence of structural and optical properties for sol-gel derived (100)-oriented Ba1-x Srx Ti O3 thin films

G. S. Wang; Y. Y. Zhang; C. L. Mao; X. L. Dong; J. H. Chu

doi:10.1063/1.2767986

Composition dependence of structural and optical properties for sol-gel derived (100)-oriented Ba1-x Srx Ti O3 thin films

G. S. Wang^*
, Y. Y. Zhang
, C. L. Mao
, X. L. Dong
, J. H. Chu

^*Corresponding author for this work

Research output: Contribution to journal › Article › peer-review

11 Scopus citations

Abstract

Highly (100) oriented Ba1-x Srx Ti O3 (BST) thin films were grown on LaNi O3 coated silicon substrate by modified sol-gel process. X-ray diffraction analysis shows that the out-of-plane lattice constant decreases linearly with increase of Sr concentration. The energy band gaps (Eg) of BST thin films exhibit strong dependence on Sr content by analyzing the results of the spectroscopic ellipsometer (SE) measurement. The smallest Eg has been obtained at x=0.3, which is at the phase boundary of cube phase and tetragonal phase. The refractive index and thickness of BST thin films were obtained by fitting SE data with a multiphase model.

Original language	English
Article number	061104
Journal	Applied Physics Letters
Volume	91
Issue number	6
DOIs	https://doi.org/10.1063/1.2767986
State	Published - 2007
Externally published	Yes

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title = "Composition dependence of structural and optical properties for sol-gel derived (100)-oriented Ba1-x Srx Ti O3 thin films",

abstract = "Highly (100) oriented Ba1-x Srx Ti O3 (BST) thin films were grown on LaNi O3 coated silicon substrate by modified sol-gel process. X-ray diffraction analysis shows that the out-of-plane lattice constant decreases linearly with increase of Sr concentration. The energy band gaps (Eg) of BST thin films exhibit strong dependence on Sr content by analyzing the results of the spectroscopic ellipsometer (SE) measurement. The smallest Eg has been obtained at x=0.3, which is at the phase boundary of cube phase and tetragonal phase. The refractive index and thickness of BST thin films were obtained by fitting SE data with a multiphase model.",

author = "Wang, \{G. S.\} and Zhang, \{Y. Y.\} and Mao, \{C. L.\} and Dong, \{X. L.\} and Chu, \{J. H.\}",

year = "2007",

doi = "10.1063/1.2767986",

language = "英语",

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journal = "Applied Physics Letters",

issn = "0003-6951",

publisher = "American Institute of Physics",

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TY - JOUR

T1 - Composition dependence of structural and optical properties for sol-gel derived (100)-oriented Ba1-x Srx Ti O3 thin films

AU - Wang, G. S.

AU - Zhang, Y. Y.

AU - Mao, C. L.

AU - Dong, X. L.

AU - Chu, J. H.

PY - 2007

Y1 - 2007

N2 - Highly (100) oriented Ba1-x Srx Ti O3 (BST) thin films were grown on LaNi O3 coated silicon substrate by modified sol-gel process. X-ray diffraction analysis shows that the out-of-plane lattice constant decreases linearly with increase of Sr concentration. The energy band gaps (Eg) of BST thin films exhibit strong dependence on Sr content by analyzing the results of the spectroscopic ellipsometer (SE) measurement. The smallest Eg has been obtained at x=0.3, which is at the phase boundary of cube phase and tetragonal phase. The refractive index and thickness of BST thin films were obtained by fitting SE data with a multiphase model.

AB - Highly (100) oriented Ba1-x Srx Ti O3 (BST) thin films were grown on LaNi O3 coated silicon substrate by modified sol-gel process. X-ray diffraction analysis shows that the out-of-plane lattice constant decreases linearly with increase of Sr concentration. The energy band gaps (Eg) of BST thin films exhibit strong dependence on Sr content by analyzing the results of the spectroscopic ellipsometer (SE) measurement. The smallest Eg has been obtained at x=0.3, which is at the phase boundary of cube phase and tetragonal phase. The refractive index and thickness of BST thin films were obtained by fitting SE data with a multiphase model.

UR - https://www.scopus.com/pages/publications/34547829423

U2 - 10.1063/1.2767986

DO - 10.1063/1.2767986

M3 - 文章

AN - SCOPUS:34547829423

SN - 0003-6951

VL - 91

JO - Applied Physics Letters

JF - Applied Physics Letters

IS - 6

M1 - 061104

ER -

Composition dependence of structural and optical properties for sol-gel derived (100)-oriented Ba1-x Srx Ti O3 thin films

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