Abstract
Cd1-xZnxTe films were deposited by dual targets magnetron sputtering co-deposition. The composition error was found to be Δ x < 0.013. The influences of growth temperature on the crystalline characteristics were determined by X-ray diffraction(XRD). SEM and AFM results show that the films have flat surfaces and clear interfaces. Optical energy gaps of Cd1-xZnxTe films with different x were simulated from the transmittance measurements.
| Original language | English |
|---|---|
| Pages (from-to) | 341-344+364 |
| Journal | Rengong Jingti Xuebao/Journal of Synthetic Crystals |
| Volume | 39 |
| Issue number | 2 |
| State | Published - Apr 2010 |
| Externally published | Yes |
Keywords
- CdZnTe films
- Magnetron sputtering
- Transmittion