Composite degradation model and corresponding failure mechanism for mid-power GaN-based white LEDs

The degradation mechanism of mid-power GaN-based white LEDs were investigated by using the in-situ multi-functional accelerated aging tests. The changes of the luminous flux and the chromaticity shift during the stress time show some correlations. To quantitatively analyze the degradation behavior, a composite model considering the luminous flux increasing and decreasing mechanisms was proposed and the results agree well with the experiments in the entire aging time. Furthermore, different analytical technologies have been used to understand the cause of luminous flux degradation and chromaticity shift. The results show that the chromaticity shift was mainly due to the phosphors deterioration, while the serious degradation of luminous flux was the overall effects from the package, including the phosphors deterioration and oxidation of silicone encapsulant.