Commentary: The khamis/higgins model

Haiyan Xu; Yincai Tang

doi:10.1109/TR.2003.808472

Commentary: The khamis/higgins model

Haiyan Xu
, Yincai Tang

Shanghai Normal University

Research output: Contribution to journal › Article › peer-review

17 Scopus citations

Abstract

The 'KH model' which was proposed by Khamis & Higgins was studied. It was found that the acceleration of failure when the stress was raised from a lower level to a higher level was reflected in the hazard-rate function. It was shown that the given model was not a new model but was a special case of the multiple step-stress tampered failure rate (TFR) model for Weibull distributions.

Original language	English
Pages (from-to)	4-6
Number of pages	3
Journal	IEEE Transactions on Reliability
Volume	52
Issue number	1
DOIs	https://doi.org/10.1109/TR.2003.808472
State	Published - Mar 2003
Externally published	Yes

Keywords

Cumulative exposure model
Khamis/Higgins model
Step-stress accelerated life test
Tampered failure-rate model
Weibull distribution

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10.1109/TR.2003.808472

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abstract = "The 'KH model' which was proposed by Khamis \& Higgins was studied. It was found that the acceleration of failure when the stress was raised from a lower level to a higher level was reflected in the hazard-rate function. It was shown that the given model was not a new model but was a special case of the multiple step-stress tampered failure rate (TFR) model for Weibull distributions.",

keywords = "Cumulative exposure model, Khamis/Higgins model, Step-stress accelerated life test, Tampered failure-rate model, Weibull distribution",

author = "Haiyan Xu and Yincai Tang",

year = "2003",

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KW - Step-stress accelerated life test

KW - Tampered failure-rate model

KW - Weibull distribution

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Commentary: The khamis/higgins model

Abstract

Keywords

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