TY - JOUR
T1 - Combining scanning electron microscopy and fast Fourier transform for characterizing mesopore and defect structures in mesoporous materials
AU - Zeng, Yi
AU - Liu, Ziwei
AU - Wu, Wei
AU - Xu, Fangfang
AU - Shi, Jianlin
N1 - Publisher Copyright:
© 2015 Elsevier Inc. All rights reserved.
PY - 2016/1/15
Y1 - 2016/1/15
N2 - The mesopore structure is normally determined through Transmission Electron Microscopy (TEM). In this study, a novel technique is proposed for assessing the surface and interior planar pore structures, plane groups of ordered pore arrangements and defect structures in a number of mesoporous materials through a combination of SEM imaging, ion milling and fast Fourier transformation (FFT). This strategy provides a unique and facile approach to characterize the surface and inner pore structures and interior defects of bulky mesoporous materials with varied complex structures.
AB - The mesopore structure is normally determined through Transmission Electron Microscopy (TEM). In this study, a novel technique is proposed for assessing the surface and interior planar pore structures, plane groups of ordered pore arrangements and defect structures in a number of mesoporous materials through a combination of SEM imaging, ion milling and fast Fourier transformation (FFT). This strategy provides a unique and facile approach to characterize the surface and inner pore structures and interior defects of bulky mesoporous materials with varied complex structures.
KW - Cross section ion polishing
KW - Fast Fourier transformation
KW - Mesoporous materials
KW - Scanning electron microscopy
UR - https://www.scopus.com/pages/publications/84941776073
U2 - 10.1016/j.micromeso.2015.09.001
DO - 10.1016/j.micromeso.2015.09.001
M3 - 文章
AN - SCOPUS:84941776073
SN - 1387-1811
VL - 220
SP - 163
EP - 167
JO - Microporous and Mesoporous Materials
JF - Microporous and Mesoporous Materials
ER -