Clock skew analysis based on NBTI degeneration of pMOSFET

Research output: Chapter in Book/Report/Conference proceedingConference contributionpeer-review

Abstract

In this paper, a set of formulas which are sensitive to the shift in threshold voltage (AVth) of PMOS transistor, load capacitance (CL), and input transition (ti) have been explored to calculate the propagation delay of CMOS inverter using curved surfaces fitting. Different from conventional of focusing on load capacitance and input transition, our proposed model pay more attention to the impact of AVth variation caused by NBTI degeneration on the propagation delay. Moreover, this paper has also proposed a framework to calculate the path delay and clock skew of clock tree network based on the proposed delay model. In order to validate our proposed models and methods, the SPICE-level simulation of the benchmark circuit (s38417) has been compared with our model calculation using a 45-nm CMOS process technology, the results show that our models and methods can calculate the extra path delay and clock skew caused by the shift in threshold voltage.

Original languageEnglish
Title of host publicationProceedings of 2016 IEEE International Conference on Integrated Circuits and Microsystems, ICICM 2016
PublisherInstitute of Electrical and Electronics Engineers Inc.
Pages319-323
Number of pages5
ISBN (Electronic)9781509028146
DOIs
StatePublished - 10 Jan 2017
Event2016 IEEE International Conference on Integrated Circuits and Microsystems, ICICM 2016 - Chengdu, China
Duration: 23 Nov 201625 Nov 2016

Publication series

NameProceedings of 2016 IEEE International Conference on Integrated Circuits and Microsystems, ICICM 2016

Conference

Conference2016 IEEE International Conference on Integrated Circuits and Microsystems, ICICM 2016
Country/TerritoryChina
CityChengdu
Period23/11/1625/11/16

Keywords

  • 45-nm CMOS process
  • NBTI degeneration
  • clock tree
  • modeling
  • the propagation delay of inverter

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