Characterization of Mn1.56 Co0.96 Ni 0.48O4 films for infrared detection

Yun Hou; Zhiming Huang; Yanqing Gao; Yujian Ge; Jing Wu; Junhao Chu

doi:10.1063/1.2936292

Characterization of Mn_1.56 Co_0.96 Ni _0.48O₄ films for infrared detection

Yun Hou, Zhiming Huang, Yanqing Gao, Yujian Ge, Jing Wu, Junhao Chu

CAS - Shanghai Institute of Technical Physics

Research output: Contribution to journal › Article › peer-review

91 Scopus citations

Abstract

Mn1.56Co0.96Ni0.48O4 films with spinel structure were prepared on Al2 O3 substrate by chemical solution deposition method. The microstructure of the films was studied by atomic force microscope and field-emission scanning electron microscope. The current-voltage characteristics showed Ohmic conductivity in the temperature range of 245-295 K. The conduction was described by a variable range hopping model for a parabolic density of states. The advantages of high characteristic temperature, as well as high transition temperature (201 K) between ferromagnetic and paramagnetic phases make the Mn_1.56 Co_0.96 Ni_0.48O₄ films very promising for infrared detection, especially for functional devices by integrating magnetic and electronic properties of the materials.

Original language	English
Article number	202115
Journal	Applied Physics Letters
Volume	92
Issue number	20
DOIs	https://doi.org/10.1063/1.2936292
State	Published - 2008
Externally published	Yes

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title = "Characterization of Mn1.56 Co0.96 Ni 0.48O4 films for infrared detection",

abstract = "Mn1.56Co0.96Ni0.48O4 films with spinel structure were prepared on Al2 O3 substrate by chemical solution deposition method. The microstructure of the films was studied by atomic force microscope and field-emission scanning electron microscope. The current-voltage characteristics showed Ohmic conductivity in the temperature range of 245-295 K. The conduction was described by a variable range hopping model for a parabolic density of states. The advantages of high characteristic temperature, as well as high transition temperature (201 K) between ferromagnetic and paramagnetic phases make the Mn1.56 Co0.96 Ni0.48O4 films very promising for infrared detection, especially for functional devices by integrating magnetic and electronic properties of the materials.",

author = "Yun Hou and Zhiming Huang and Yanqing Gao and Yujian Ge and Jing Wu and Junhao Chu",

year = "2008",

doi = "10.1063/1.2936292",

language = "英语",

volume = "92",

journal = "Applied Physics Letters",

issn = "0003-6951",

publisher = "American Institute of Physics",

number = "20",

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TY - JOUR

T1 - Characterization of Mn1.56 Co0.96 Ni 0.48O4 films for infrared detection

AU - Hou, Yun

AU - Huang, Zhiming

AU - Gao, Yanqing

AU - Ge, Yujian

AU - Wu, Jing

AU - Chu, Junhao

PY - 2008

Y1 - 2008

N2 - Mn1.56Co0.96Ni0.48O4 films with spinel structure were prepared on Al2 O3 substrate by chemical solution deposition method. The microstructure of the films was studied by atomic force microscope and field-emission scanning electron microscope. The current-voltage characteristics showed Ohmic conductivity in the temperature range of 245-295 K. The conduction was described by a variable range hopping model for a parabolic density of states. The advantages of high characteristic temperature, as well as high transition temperature (201 K) between ferromagnetic and paramagnetic phases make the Mn1.56 Co0.96 Ni0.48O4 films very promising for infrared detection, especially for functional devices by integrating magnetic and electronic properties of the materials.

AB - Mn1.56Co0.96Ni0.48O4 films with spinel structure were prepared on Al2 O3 substrate by chemical solution deposition method. The microstructure of the films was studied by atomic force microscope and field-emission scanning electron microscope. The current-voltage characteristics showed Ohmic conductivity in the temperature range of 245-295 K. The conduction was described by a variable range hopping model for a parabolic density of states. The advantages of high characteristic temperature, as well as high transition temperature (201 K) between ferromagnetic and paramagnetic phases make the Mn1.56 Co0.96 Ni0.48O4 films very promising for infrared detection, especially for functional devices by integrating magnetic and electronic properties of the materials.

UR - https://www.scopus.com/pages/publications/44349148616

U2 - 10.1063/1.2936292

DO - 10.1063/1.2936292

M3 - 文章

AN - SCOPUS:44349148616

SN - 0003-6951

VL - 92

JO - Applied Physics Letters

JF - Applied Physics Letters

IS - 20

M1 - 202115

ER -

Characterization of Mn_1.56 Co_0.96 Ni _0.48O₄ films for infrared detection

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