Characterization of Hg1-x Cdx Te epitaxial films on various vicinal planes

Blao Li; Jun Hao Chu; Ji Qian Zhu; Xin Qiang Chen; Ju Ying Cao; Ding Yuan Tang

Characterization of Hg_1-x Cd_x Te epitaxial films on various vicinal planes

Blao Li^*
, Jun Hao Chu
, Ji Qian Zhu
, Xin Qiang Chen
, Ju Ying Cao
, Ding Yuan Tang

^*Corresponding author for this work

CAS - Shanghai Institute of Technical Physics

Research output: Contribution to journal › Article › peer-review

1 Scopus citations

Abstract

The Hg_1-x Cd_x Te films were prepared by a dipping liquid phase epitaxy technique on spherical CdTe substrate with several different misoriented facets. They were characterized by means of micrograph, infrared absorption spectra, Raman scattering, and X-ray double-crystal diffraction. The results show that "near-facet" ( δ < 1°) and "terrace-free" (δ ≈ 1.2°) growth modes are superior in both the planarity and the amount of precipitates.

Original language	English
Pages (from-to)	1172-1173
Number of pages	2
Journal	Wuli Xuebao/Acta Physica Sinica
Volume	46
Issue number	6
State	Published - 1997
Externally published	Yes

Cite this

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title = "Characterization of Hg1-x Cdx Te epitaxial films on various vicinal planes",

abstract = "The Hg1-x Cdx Te films were prepared by a dipping liquid phase epitaxy technique on spherical CdTe substrate with several different misoriented facets. They were characterized by means of micrograph, infrared absorption spectra, Raman scattering, and X-ray double-crystal diffraction. The results show that {"}near-facet{"} ( δ < 1°) and {"}terrace-free{"} (δ ≈ 1.2°) growth modes are superior in both the planarity and the amount of precipitates.",

author = "Blao Li and Chu, \{Jun Hao\} and Zhu, \{Ji Qian\} and Chen, \{Xin Qiang\} and Cao, \{Ju Ying\} and Tang, \{Ding Yuan\}",

year = "1997",

language = "英语",

volume = "46",

pages = "1172--1173",

journal = "Wuli Xuebao/Acta Physica Sinica",

issn = "1000-3290",

publisher = "Chinese Physical Society and Institute of Physics, Chinese Academy of Sciences",

number = "6",

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TY - JOUR

T1 - Characterization of Hg1-x Cdx Te epitaxial films on various vicinal planes

AU - Li, Blao

AU - Chu, Jun Hao

AU - Zhu, Ji Qian

AU - Chen, Xin Qiang

AU - Cao, Ju Ying

AU - Tang, Ding Yuan

PY - 1997

Y1 - 1997

N2 - The Hg1-x Cdx Te films were prepared by a dipping liquid phase epitaxy technique on spherical CdTe substrate with several different misoriented facets. They were characterized by means of micrograph, infrared absorption spectra, Raman scattering, and X-ray double-crystal diffraction. The results show that "near-facet" ( δ < 1°) and "terrace-free" (δ ≈ 1.2°) growth modes are superior in both the planarity and the amount of precipitates.

AB - The Hg1-x Cdx Te films were prepared by a dipping liquid phase epitaxy technique on spherical CdTe substrate with several different misoriented facets. They were characterized by means of micrograph, infrared absorption spectra, Raman scattering, and X-ray double-crystal diffraction. The results show that "near-facet" ( δ < 1°) and "terrace-free" (δ ≈ 1.2°) growth modes are superior in both the planarity and the amount of precipitates.

UR - https://www.scopus.com/pages/publications/0346477560

M3 - 文章

AN - SCOPUS:0346477560

SN - 1000-3290

VL - 46

SP - 1172

EP - 1173

JO - Wuli Xuebao/Acta Physica Sinica

JF - Wuli Xuebao/Acta Physica Sinica

IS - 6

ER -

Characterization of Hg_1-x Cd_x Te epitaxial films on various vicinal planes

Abstract

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