Characterization and dynamic manipulation of graphene by in situ transmission electron microscopy at atomic scale

  • Chaolun Wang
  • , Chen Luo
  • , Xing Wu*
  • *Corresponding author for this work

Research output: Chapter in Book/Report/Conference proceedingChapterpeer-review

Abstract

Graphene that possesses atomic thin geometry and remarkable properties is a star material for fundamental researches and advanced applications. The intrinsic and dynamic relationships among the crystal structures, chemical compositions, and electronic structures of graphene are critical and fundamental to understand its physical properties. With the advanced TEM technologies, such as aberration correction and low-voltage technologies, the morphology, crystal structure, chemical composition, and electronic structures of graphene can be directly characterized at atomic scale. In addition, the development of microelectromechanical systems enables the applications of external stimuli, such as thermal, electrical, mechanical, and environmental fields on graphene inside an in situ TEM. By applying the advanced in situ TEM, graphene could be manipulated under external fields and recorded in real time with atomic resolution. In this chapter, we introduce the applications of state-of-the-art TEM technologies on the studies of intrinsic and dynamic properties of graphene.

Original languageEnglish
Title of host publicationHandbook of Graphene
PublisherWiley-Blackwell
Pages291-314
Number of pages24
Volume8
ISBN (Print)9781119468455
StatePublished - 29 Mar 2019

Keywords

  • Characterization
  • Graphene
  • In situ manipulation
  • Transmission electron microscopy
  • Two-dimensional layered materials

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