TY - JOUR
T1 - Characteristics of Au/PbZr0.52Ti0.48O3/YBa2Cu3O7−δ capacitors fabricated on LaAlO3 and Y2O3-stabilized ZrO2 infstrates during irradiation
AU - Gao, Jianxia
AU - Zheng, Lirong
AU - Song, Zhitang
AU - Wang, Lianwei
AU - Yang, Lixin
AU - Zhu, Dezhang
AU - Lin, Chenglu
PY - 1999/6
Y1 - 1999/6
N2 - PbZr0.52Ti0.48O3 (PZT)/YBa2Cu3O7−δ (YBCO) structures were fabricated on LaAlO3 and Y2O3-stabilized ZrO2 (YSZ) infstrates by a pulsed-excimer-laser deposition method. The total dose effects on the Au/PZT/YBCO ferroelectric capacitors were considered by measuring the capacitance-voltage (C-V) characteristics and the retained polarization properties of the capacitor before and after γ-ray irradiation. The results show that, with an increase of irradiation dose, for a ferroelectric capacitor which was fabricated on a LaAlO3 infstrate, the retained polarization ΔP and the dielectric constant ε decreased, but the absolute value of the negative and positive coercive fields increased. For a ferroelectric capacitor which was fabricated on a YSZ infstrate, ΔP and ε also decreased while the coercive fields drifted towards the positive voltage direction. All these facts are due to the effect of charges trapped by defects in the PZT layer and the interface of the capacitor during irradiation.
AB - PbZr0.52Ti0.48O3 (PZT)/YBa2Cu3O7−δ (YBCO) structures were fabricated on LaAlO3 and Y2O3-stabilized ZrO2 (YSZ) infstrates by a pulsed-excimer-laser deposition method. The total dose effects on the Au/PZT/YBCO ferroelectric capacitors were considered by measuring the capacitance-voltage (C-V) characteristics and the retained polarization properties of the capacitor before and after γ-ray irradiation. The results show that, with an increase of irradiation dose, for a ferroelectric capacitor which was fabricated on a LaAlO3 infstrate, the retained polarization ΔP and the dielectric constant ε decreased, but the absolute value of the negative and positive coercive fields increased. For a ferroelectric capacitor which was fabricated on a YSZ infstrate, ΔP and ε also decreased while the coercive fields drifted towards the positive voltage direction. All these facts are due to the effect of charges trapped by defects in the PZT layer and the interface of the capacitor during irradiation.
UR - https://www.scopus.com/pages/publications/0032655421
U2 - 10.1080/13642819908214843
DO - 10.1080/13642819908214843
M3 - 文章
AN - SCOPUS:0032655421
SN - 1364-2812
VL - 79
SP - 829
EP - 838
JO - Philosophical Magazine B: Physics of Condensed Matter; Statistical Mechanics, Electronic, Optical and Magnetic Properties
JF - Philosophical Magazine B: Physics of Condensed Matter; Statistical Mechanics, Electronic, Optical and Magnetic Properties
IS - 6
ER -