TY - GEN
T1 - CDB
T2 - 59th ACM/IEEE Design Automation Conference, DAC 2022
AU - Luo, Longfei
AU - Yu, Dingcui
AU - Shi, Liang
AU - Ding, Chuanmin
AU - Li, Changlong
AU - Sha, Edwin H.M.
N1 - Publisher Copyright:
© 2022 ACM.
PY - 2022/7/10
Y1 - 2022/7/10
N2 - Hybrid flash based storage constructed with high-density and low-cost flash memory are becoming increasingly popular in consumer devices during the last decade. However, to protect critical data, existing methods are designed for improving reliability of consumer devices with non-hybrid flash storage. Based on evaluations and analysis, these methods will result in significant performance and lifetime degradation in consumer devices with hybrid storage. The reason is that different kinds of memory in hybrid storage have different characteristics, such as performance and access granularity. To address the above problems, a critical data backup (CDB) method is proposed to backup designated critical data with making full use of different kinds of memory in hybrid storage. Experiment results show that compared with the state-of-the-arts, CDB achieves encouraging performance and lifetime improvement.
AB - Hybrid flash based storage constructed with high-density and low-cost flash memory are becoming increasingly popular in consumer devices during the last decade. However, to protect critical data, existing methods are designed for improving reliability of consumer devices with non-hybrid flash storage. Based on evaluations and analysis, these methods will result in significant performance and lifetime degradation in consumer devices with hybrid storage. The reason is that different kinds of memory in hybrid storage have different characteristics, such as performance and access granularity. To address the above problems, a critical data backup (CDB) method is proposed to backup designated critical data with making full use of different kinds of memory in hybrid storage. Experiment results show that compared with the state-of-the-arts, CDB achieves encouraging performance and lifetime improvement.
UR - https://www.scopus.com/pages/publications/85137486002
U2 - 10.1145/3489517.3530468
DO - 10.1145/3489517.3530468
M3 - 会议稿件
AN - SCOPUS:85137486002
T3 - Proceedings - Design Automation Conference
SP - 391
EP - 396
BT - Proceedings of the 59th ACM/IEEE Design Automation Conference, DAC 2022
PB - Institute of Electrical and Electronics Engineers Inc.
Y2 - 10 July 2022 through 14 July 2022
ER -