Calibration standards and measurement accuracy of absolute electroluminescence and internal properties in multi-junction and arrayed solar cells

Masahiro Yoshita; Lin Zhu; Changsu Kim; Toshimitsu Mochizuki; Tetsuya Nakamura; Mitsuru Imaizumi; Shaoqiang Chen; Hidehiro Kubota; Yoshihiko Kanemitsu; Hidefumi Akiyama

doi:10.1117/12.2211726

Calibration standards and measurement accuracy of absolute electroluminescence and internal properties in multi-junction and arrayed solar cells

Masahiro Yoshita, Lin Zhu, Changsu Kim, Toshimitsu Mochizuki, Tetsuya Nakamura, Mitsuru Imaizumi, Shaoqiang Chen, Hidehiro Kubota, Yoshihiko Kanemitsu, Hidefumi Akiyama

School of Communication and Electronic Engineering

Research output: Chapter in Book/Report/Conference proceeding › Conference contribution › peer-review

6 Scopus citations

Abstract

We developed methodologies and calibration standards for absolute electroluminescence (EL) measurements for CONTACT-LESS evaluation of various internal properties of multi-junction and arrayed solar cells, such as open-circuit voltages, external and internal radiative efficiencies, and luminescence-coupling efficiency. Several independent calibration methods were compared that used: 1) a calibrated EL imaging system, 2) proximity measurement with a large-area photodiode, 3) an integrating-sphere system, and 4) planar light-emitting diodes with a circular aperture. The comparison clarified the advantages and disadvantages of each method, and showed consistency within 30% uncertainty, resulting in a 7-meV uncertainty in open-circuit voltage measurements.

Original language	English
Title of host publication	Physics, Simulation, and Photonic Engineering of Photovoltaic Devices V
Editors	Masakazu Sugiyama, Alexandre Freundlich, Laurent Lombez
Publisher	SPIE
ISBN (Electronic)	9781628419788
DOIs	https://doi.org/10.1117/12.2211726
State	Published - 2016
Event	Physics, Simulation, and Photonic Engineering of Photovoltaic Devices V - San Francisco, United States Duration: 15 Feb 2016 → 17 Feb 2016

Publication series

Name	Proceedings of SPIE - The International Society for Optical Engineering
Volume	9743
ISSN (Print)	0277-786X
ISSN (Electronic)	1996-756X

Conference

Conference	Physics, Simulation, and Photonic Engineering of Photovoltaic Devices V
Country/Territory	United States
City	San Francisco
Period	15/02/16 → 17/02/16

Keywords

Calibration standard
Electroluminescence
Imaging
Internal properties
Multi-junction solar cells
Open-circuit voltage
Photovoltaics

Access to Document

10.1117/12.2211726

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Yoshita, M., Zhu, L., Kim, C., Mochizuki, T., Nakamura, T., Imaizumi, M., Chen, S., Kubota, H., Kanemitsu, Y., & Akiyama, H. (2016). Calibration standards and measurement accuracy of absolute electroluminescence and internal properties in multi-junction and arrayed solar cells. In M. Sugiyama, A. Freundlich, & L. Lombez (Eds.), Physics, Simulation, and Photonic Engineering of Photovoltaic Devices V Article 97430D (Proceedings of SPIE - The International Society for Optical Engineering; Vol. 9743). SPIE. https://doi.org/10.1117/12.2211726

Yoshita, Masahiro ; Zhu, Lin ; Kim, Changsu et al. / Calibration standards and measurement accuracy of absolute electroluminescence and internal properties in multi-junction and arrayed solar cells. Physics, Simulation, and Photonic Engineering of Photovoltaic Devices V. editor / Masakazu Sugiyama ; Alexandre Freundlich ; Laurent Lombez. SPIE, 2016. (Proceedings of SPIE - The International Society for Optical Engineering).

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title = "Calibration standards and measurement accuracy of absolute electroluminescence and internal properties in multi-junction and arrayed solar cells",

abstract = "We developed methodologies and calibration standards for absolute electroluminescence (EL) measurements for CONTACT-LESS evaluation of various internal properties of multi-junction and arrayed solar cells, such as open-circuit voltages, external and internal radiative efficiencies, and luminescence-coupling efficiency. Several independent calibration methods were compared that used: 1) a calibrated EL imaging system, 2) proximity measurement with a large-area photodiode, 3) an integrating-sphere system, and 4) planar light-emitting diodes with a circular aperture. The comparison clarified the advantages and disadvantages of each method, and showed consistency within 30\% uncertainty, resulting in a 7-meV uncertainty in open-circuit voltage measurements.",

keywords = "Calibration standard, Electroluminescence, Imaging, Internal properties, Multi-junction solar cells, Open-circuit voltage, Photovoltaics",

author = "Masahiro Yoshita and Lin Zhu and Changsu Kim and Toshimitsu Mochizuki and Tetsuya Nakamura and Mitsuru Imaizumi and Shaoqiang Chen and Hidehiro Kubota and Yoshihiko Kanemitsu and Hidefumi Akiyama",

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year = "2016",

doi = "10.1117/12.2211726",

language = "英语",

series = "Proceedings of SPIE - The International Society for Optical Engineering",

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editor = "Masakazu Sugiyama and Alexandre Freundlich and Laurent Lombez",

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Yoshita, M, Zhu, L, Kim, C, Mochizuki, T, Nakamura, T, Imaizumi, M, Chen, S, Kubota, H, Kanemitsu, Y & Akiyama, H 2016, Calibration standards and measurement accuracy of absolute electroluminescence and internal properties in multi-junction and arrayed solar cells. in M Sugiyama, A Freundlich & L Lombez (eds), Physics, Simulation, and Photonic Engineering of Photovoltaic Devices V., 97430D, Proceedings of SPIE - The International Society for Optical Engineering, vol. 9743, SPIE, Physics, Simulation, and Photonic Engineering of Photovoltaic Devices V, San Francisco, United States, 15/02/16. https://doi.org/10.1117/12.2211726

Calibration standards and measurement accuracy of absolute electroluminescence and internal properties in multi-junction and arrayed solar cells. / Yoshita, Masahiro; Zhu, Lin; Kim, Changsu et al.
Physics, Simulation, and Photonic Engineering of Photovoltaic Devices V. ed. / Masakazu Sugiyama; Alexandre Freundlich; Laurent Lombez. SPIE, 2016. 97430D (Proceedings of SPIE - The International Society for Optical Engineering; Vol. 9743).

Research output: Chapter in Book/Report/Conference proceeding › Conference contribution › peer-review

TY - GEN

T1 - Calibration standards and measurement accuracy of absolute electroluminescence and internal properties in multi-junction and arrayed solar cells

AU - Yoshita, Masahiro

AU - Zhu, Lin

AU - Kim, Changsu

AU - Mochizuki, Toshimitsu

AU - Nakamura, Tetsuya

AU - Imaizumi, Mitsuru

AU - Chen, Shaoqiang

AU - Kubota, Hidehiro

AU - Kanemitsu, Yoshihiko

AU - Akiyama, Hidefumi

PY - 2016

Y1 - 2016

N2 - We developed methodologies and calibration standards for absolute electroluminescence (EL) measurements for CONTACT-LESS evaluation of various internal properties of multi-junction and arrayed solar cells, such as open-circuit voltages, external and internal radiative efficiencies, and luminescence-coupling efficiency. Several independent calibration methods were compared that used: 1) a calibrated EL imaging system, 2) proximity measurement with a large-area photodiode, 3) an integrating-sphere system, and 4) planar light-emitting diodes with a circular aperture. The comparison clarified the advantages and disadvantages of each method, and showed consistency within 30% uncertainty, resulting in a 7-meV uncertainty in open-circuit voltage measurements.

AB - We developed methodologies and calibration standards for absolute electroluminescence (EL) measurements for CONTACT-LESS evaluation of various internal properties of multi-junction and arrayed solar cells, such as open-circuit voltages, external and internal radiative efficiencies, and luminescence-coupling efficiency. Several independent calibration methods were compared that used: 1) a calibrated EL imaging system, 2) proximity measurement with a large-area photodiode, 3) an integrating-sphere system, and 4) planar light-emitting diodes with a circular aperture. The comparison clarified the advantages and disadvantages of each method, and showed consistency within 30% uncertainty, resulting in a 7-meV uncertainty in open-circuit voltage measurements.

KW - Calibration standard

KW - Electroluminescence

KW - Imaging

KW - Internal properties

KW - Multi-junction solar cells

KW - Open-circuit voltage

KW - Photovoltaics

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DO - 10.1117/12.2211726

M3 - 会议稿件

AN - SCOPUS:84982144495

T3 - Proceedings of SPIE - The International Society for Optical Engineering

BT - Physics, Simulation, and Photonic Engineering of Photovoltaic Devices V

A2 - Sugiyama, Masakazu

A2 - Freundlich, Alexandre

A2 - Lombez, Laurent

PB - SPIE

T2 - Physics, Simulation, and Photonic Engineering of Photovoltaic Devices V

Y2 - 15 February 2016 through 17 February 2016

ER -

Yoshita M, Zhu L, Kim C, Mochizuki T, Nakamura T, Imaizumi M et al. Calibration standards and measurement accuracy of absolute electroluminescence and internal properties in multi-junction and arrayed solar cells. In Sugiyama M, Freundlich A, Lombez L, editors, Physics, Simulation, and Photonic Engineering of Photovoltaic Devices V. SPIE. 2016. 97430D. (Proceedings of SPIE - The International Society for Optical Engineering). doi: 10.1117/12.2211726

Calibration standards and measurement accuracy of absolute electroluminescence and internal properties in multi-junction and arrayed solar cells

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