Abstract
In this article, bias-dependent small-signal modeling approach based on neuro-space mapping is proposed for MOSFET. Good agreement is obtained between the simulated and measured results for a 130 nm MOSFET in the frequency range of 100 MHz-40 GHz confirming the validity and effectiveness of our approach. In addition, higher accuracy is achieved by our approach in contrast to conventional empirical model.
| Original language | English |
|---|---|
| Pages (from-to) | 182-189 |
| Number of pages | 8 |
| Journal | International Journal of RF and Microwave Computer-Aided Engineering |
| Volume | 21 |
| Issue number | 2 |
| DOIs | |
| State | Published - Mar 2011 |
Keywords
- MOSFET
- neural network
- parameter extraction
- small-signal modeling
- space mapping