Bayesian analysis of masked data in step-stress accelerated life testing

This article considers a k level step-stress accelerated life testing (ALT) on series system products, where independent Weibull-distributed lifetimes are assumed for the components. Due to cost considerations or environmental restrictions, causes of system failures are masked and type-I censored observations might occur in the collected data. Bayesian approach combined with auxiliary variables is developed for estimating the parameters of the model. Further, the reliability and hazard rate functions of the system and components are estimated at a specified time at use stress level. The proposed method is illustrated through a numerical example based on two priors and various masking probabilities.