Based simulation of high gain and low breakdown voltage InGaAs/InP avalanche photodiode

W. Lei, F. M. Guo, W. Lu, D. Y. Xiong, Z. Q. Zhu, J. H. Chu

Research output: Chapter in Book/Report/Conference proceedingConference contributionpeer-review

6 Scopus citations

Abstract

The InGaAs/InP avalanche photodiode (APD) of thin heterostructure charge layer has studied. Apsys software is used for simulation. For reducing the dark current and achieving higher avalanche gain, a 30n in InP charge layer and 100nm InGaAsP grade charge layer used between 400nm multiplication and absorption layers. Simulation results demonstrated that the low dark current properties and low breakdown voltage (17.5V) had achieved. The avalanche gain is 88 at reverse bias voltage 17.2V, and reached 300 at 17.4V before break down.

Original languageEnglish
Title of host publication2008 International Conference on Numerical Simulation of Optoelectronic Devices, NUSOD'08
Pages37-38
Number of pages2
DOIs
StatePublished - 2008
Event2008 International Conference on Numerical Simulation of Optoelectronic Devices, NUSOD'08 - Nottingham, United Kingdom
Duration: 1 Sep 20084 Sep 2008

Publication series

Name2008 International Conference on Numerical Simulation of Optoelectronic Devices, NUSOD'08

Conference

Conference2008 International Conference on Numerical Simulation of Optoelectronic Devices, NUSOD'08
Country/TerritoryUnited Kingdom
CityNottingham
Period1/09/084/09/08

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