Abstract
Complex oxide heterointerfaces, which play host to an incredible variety of interface physical phenomena, are of great current interest in introducing new functionalities to systems. Here, coherent super-tetragonal BiFeO 3/LaAlO3 and rhombohedral BiFeO3/LaAlO 3 heterointerfaces are investigated by using a combination of high-angle annular dark-field (HAADF) imaging and annular bright-field (ABF) imaging in a spherical aberration (Cs) corrected scanning transmission electron microscope (STEM), and first-principles calculations. The complicated ferroelectric polarization pinning and relaxation that occurs at both interfaces is revealed with atomic resolution, with a dramatic change in structure of BiFeO3, from cubic to super-tetragonal-like. The results enable a detailed explanation to be given of how non-bulk phase structures are stabilized in thin films of this material. Changes in lattice strain and symmetry in BiFeO3 (BFO) crystals at coherent T-BFO/LaAlO3 (LAO) and rhombohedral-BFO/LAO interfaces are imaged with atomic resolution using annular bright-field scanning transmission electron microscopy and first-principles calculations. A common pinned BFO layer and polarization relaxation at the interfaces are identified, providing insight into the ferroelectric behavior of thin films and the complex oxide heterointerfaces between them.
| Original language | English |
|---|---|
| Pages (from-to) | 793-799 |
| Number of pages | 7 |
| Journal | Advanced Functional Materials |
| Volume | 24 |
| Issue number | 6 |
| DOIs | |
| State | Published - 12 Feb 2014 |
Keywords
- annular bright-field imaging
- bismuth ferrite
- heterointerfaces