Arsenic-doped narrow-gap HgCdTe epilayers studied by infrared modulation spectroscopy

Jun Shao*, Wei Lu, Lu Chen, Xiang Lu, Shaoling Guo, Junhao Chu, Li He

*Corresponding author for this work

Research output: Chapter in Book/Report/Conference proceedingConference contributionpeer-review

Abstract

We outline experimental data recently established in our study of in-situ arsenic (As) doped narrow-gap Hg1-xCdxTe films by infrared modulation spectroscopy. After a brief introduction of the step-scan Fourier transform infrared spectrometer-based modulation spectroscopic techniques, impurity levels and photomodulation mechanisms in As-doped HgCdTe epilayers are surveyed based on infrared modulation spectroscopic data, and the possibility of identifying cutoff wavelength and vertical uniformity of HgCdTe epilayers is indicated. The results illustrate that the infrared modulation spectroscopy will play an important role in optical characterization of narrow-gap semiconductors.

Original languageEnglish
Title of host publicationSeventh International Conference on Thin Film Physics and Applications
DOIs
StatePublished - 2011
Externally publishedYes
Event7th International Conference on Thin Film Physics and Applications - Shanghai, China
Duration: 24 Sep 201027 Sep 2010

Publication series

NameProceedings of SPIE - The International Society for Optical Engineering
Volume7995
ISSN (Print)0277-786X

Conference

Conference7th International Conference on Thin Film Physics and Applications
Country/TerritoryChina
CityShanghai
Period24/09/1027/09/10

Keywords

  • HgCdTe
  • Infrared modulation spectroscopy
  • P-type doping
  • Photoluminescence
  • Photoreflectance

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