Abstract
Vertically stacking two-dimensional (2D) materials can enable the design of novel electronic and optoelectronic devices and realize complex functionality. However, the fabrication of such artificial heterostructures on a wafer scale with an atomically sharp interface poses an unprecedented challenge. Here, we demonstrate a convenient and controllable approach for the production of wafer-scale 2D GaSe thin films by molecular beam epitaxy. In situ reflection high-energy electron diffraction oscillations and Raman spectroscopy reveal a layer-by-layer van der Waals epitaxial growth mode. Highly efficient photodetector arrays were fabricated, based on few-layer GaSe on Si. These photodiodes show steady rectifying characteristics and a high external quantum efficiency of 23.6%. The resultant photoresponse is super-fast and robust, with a response time of 60 μs. Importantly, the device shows no sign of degradation after 1 million cycles of operation. We also carried out numerical simulations to understand the underlying device working principles. Our study establishes a new approach to produce controllable, robust, and large-area 2D heterostructures and presents a crucial step for further practical applications.
| Original language | English |
|---|---|
| Pages (from-to) | 3571-3577 |
| Number of pages | 7 |
| Journal | Nano Letters |
| Volume | 15 |
| Issue number | 5 |
| DOIs | |
| State | Published - 13 May 2015 |
| Externally published | Yes |
Keywords
- 2D materials
- GaSe
- molecular beam epitaxy
- p-n junctions
- photodiodes
- van der Waals heterostructure