Approximate analytical channel potential model of poly-Si thin film transistors operated in the strong inversion region under the high gate and low drain biases

Research output: Contribution to journalConference articlepeer-review

4 Scopus citations

Abstract

An approximate analytical channel potential model of polycrystalline silicon thin film transistors operated in the strong inversion region under the high gate and low drain biases is proposed. Thus, the linear relationship between the channel potential and the drain voltage is derived in the strong inversion region under the above bias condition when the polysilicon layer is ultrathin. This model agrees with the two-dimensional-device simulation results under different gate voltages, different drain voltages and different channel lengths. By comparing the relative errors between the model and the simulation results, it presents that this model is more suitable under the higher gate voltage Vg or the lower drain voltage Vd, regardless of the channel length. And this approximate analytical model is helpful in solving the two- dimensional-device problem by one-dimensional Poisson's equation since the drain bias is taken into account in the channel potential.

Original languageEnglish
Article number012100
JournalJournal of Physics: Conference Series
Volume574
Issue number1
DOIs
StatePublished - 2014
Event3rd International Conference on Mathematical Modeling in Physical Sciences, IC-MSQUARE 2014 - Madrid, Spain
Duration: 28 Aug 201431 Aug 2014

Fingerprint

Dive into the research topics of 'Approximate analytical channel potential model of poly-Si thin film transistors operated in the strong inversion region under the high gate and low drain biases'. Together they form a unique fingerprint.

Cite this