Antiferromagnetic Layer Thickness Dependence of the Magnetization Reversal in the Epitaxial MnPd/Fe Exchange Bias System

We report an investigation on the antiferromagnetic layer thickness dependence of magnetization reversal in c-axis oriented MnPd/Fe epitaxial exchange biased bilayers. Several kinds of multistep loops were observed for different samples measured at various field orientation. The evolution of the angular dependent magnetic behavior evolving from a representative Fe film to the exchange biased bilayers was revealed. With increase of the thickness of the antiferromagnetic layers, asymmetrically shaped loops and biased two-step loops are induced by exchange bias. Including the unidirectional anisotropy, a model based on the domain nucleation and propagation was developed, which can nicely describe the evolution of the magnetic behaviors for MnPd/Fe bilayers and correctly predicts the critical angles separating the occurrence of different magnetic switching processes. For fields applied along the bias direction, the 180° magnetic reversal changes from two successive 90° domain wall nucleations to a single 180° domain wall nucleation at the critical thickness of the MnPd layer.